SFFSA40 December 2024 OPA354A-Q1
Figure 4-1 shows the OPA354A-Q1 pin diagram for the SOT-23 | DBV package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the OPA354A-Q1 data sheet.
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| OUT | 1 | Short to GND can cause device to overheat. | B |
| V- | 2 | Normal operation, unless dual supply voltage is intended. | D |
| +IN | 3 | Input at V- (GND) is valid input, however, desired application result is unlikely. | C |
| -IN | 4 | Input at V- (GND) is valid input, however, desired application result is unlikely. | C |
| V+ | 5 | Diodes from input to V+ can turn on due to input signal and cause electrical overstress (EOS). | A |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| OUT | 1 | Output can be left open. There is no effect on the device, but the output is not measured. | C |
| V- | 2 | Lowest voltage output pin tries to power the V- pin of the device. | B |
| +IN | 3 | Floating input, circuit likely does not function as expected. | C |
| -IN | 4 | Floating input, circuit likely does not function as expected. | C |
| V+ | 5 | Highest voltage output pin tries to power the V+ pin of the device. | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| OUT | 1 | V- | Short to V- can cause device to overheat. | B |
| V- | 2 | +IN | Input at V- (GND) is valid input, however, desired application result is unlikely. | C |
| +IN | 3 | -IN | No damage to device. Application circuit does not work. Pins are not adjacent to each other. | C |
| -IN | 4 | V+ | Input at V+ is a valid input, however, desired application result is unlikely. Pins are not as near to each other, due to package type. | B |
| V+ | 5 | OUT | Short to VS+ can cause device to overheat. Pins are not adjacent to each other. | B |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| OUT | 1 | Short to V+ can cause device to overheat. | B |
| V- | 2 | Diodes from input to V- can turn on due to input signal and cause electrical overstress (EOS). | A |
| +IN | 3 | Input at V+ is a valid input, however, desired application result is unlikely. | C |
| -IN | 4 | Input at V+ is a valid input, however, desired application result is unlikely. | C |
| V+ | 5 | Normal Operation. | D |