SLLA541 December   2020 TCAN1144-Q1 , TCAN1146-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Hardware Component Failure Modes Effects and Diagnostics Analysis (FMEDA)
    1. 2.1 Random Fault Estimation
      1. 2.1.1 Fault Rate Estimation Theory for Packaging
      2. 2.1.2 Fault Estimation Theory for Silicon Permanent Faults
      3. 2.1.3 Fault Estimation Theory for Silicon Transient Faults
      4. 2.1.4 The Classification of Failure Categories and Calculation
    2. 2.2 Using the FMEDA Spreadsheet Tool
      1. 2.2.1 Mission Profile Tailoring Tab
        1. 2.2.1.1 Confidence Level
        2. 2.2.1.2 Geographical Location
        3. 2.2.1.3 Life Cycle
        4. 2.2.1.4 Use Case Thermal Management Control (Theta-Ja) and Use Case Power
        5. 2.2.1.5 Safe vs Non-Safe (Safe Fail Fraction) for Each Component Type
        6. 2.2.1.6 Analog FIT Distribution Method
        7. 2.2.1.7 Operational Profile
      2. 2.2.2 Pin Level Tailoring Tab
      3. 2.2.3 Function and Diag Tailoring Tab
      4. 2.2.4 Diagnostic Coverage Tab
      5. 2.2.5 Customer Defined Diagnostics Tab
      6. 2.2.6 Totals - ISO26262 Tab
      7. 2.2.7 Details - ISO26262 Tab
    3. 2.3 Example Calculation of Metrics
      1. 2.3.1 Assumptions of Use for Calculation of Safety Metrics
      2. 2.3.2 Summary of ISO 26262 Safety Metrics at Device Level

Summary of ISO 26262 Safety Metrics at Device Level

Table 2-2 provides estimates of FIT rates and calculated safety metrics per ISO 26262-5:2018 using previously noted assumptions for the device.

Table 2-2 ISO 26262 FIT Rate Estimates and Safety Metrics for TCAN1144DMT-Q1 and TCAN1146DMT-Q1
DiePackageOverall
PermanentTransientPermanentSum
Total FIT (Raw FIT)λ11.300.149.0322.47
Safety Related FITλSR11.300.148.8222.47
Probabilistic Metrics for Random Hardware Failures (in FIT)PMHF4.650.070.425.14
Single Point Fault Metric SPFM65.01%50.00%95.27%76.91%
Latent Fault MetricLFM83.13%NA95.50%89.23%
Table 2-3 ISO 26262 FIT Rate Estimates and Safety Metrics for TCAN1144D-Q1 and TCAN1146D-Q1
DiePackageOverall
PermanentTransientPermanentSum
Total FIT (Raw FIT)λ17.600.1428.5146.25
Safety Related FITλSR17.600.1427.8345.57
Probabilistic Metrics for Random Hardware Failures (in FIT)PMHF6.160.071.327.55
Single Point Fault Metric SPFM65.01%50.00%95.27%83.44%
Latent Fault MetricLFM83.13%NA95.50%91.77%
Table 2-4 ISO 26262 FIT Rate Estimates and Safety Metrics for TCAN1144DYY-Q1 and TCAN1146DYY-Q1
DiePackageOverall
PermanentTransientPermanentSum
Total FIT (Raw FIT)λ18.030.147.4325.60
Safety Related FITλSR18.030.147.2525.43
Probabilistic Metrics for Random Hardware Failures (in FIT)PMHF6.310.070.346.72
Single Point Fault Metric SPFM65.01%50.00%95.27%73.56%
Latent Fault MetricLFM83.13%NA95.50%87.72%