SLUUCX0A February   2024  – June 2024

 

  1.   1
  2.   Description
  3.   Features
  4.   4
  5. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
  6. 2Hardware
    1. 2.1 Recommended Power Requirements
    2. 2.2 I/O Description
    3. 2.3 Jumper Description
    4. 2.4 Setup for Different UCC57108 Variants
    5. 2.5 DESAT Setup
  7. 3Implementation Results
    1. 3.1 Out-The-Box Evaluation
    2. 3.2 Equipment Setup
      1. 3.2.1 Power Supply
      2. 3.2.2 Function Generator
      3. 3.2.3 Oscilloscope
      4. 3.2.4 Digital Multimeter (DMM)
    3. 3.3 Bench Setup
    4. 3.4 Procedure and Results
  8. 4Typical Performance Waveforms
    1. 4.1 DESAT Feature
    2. 4.2 Bipolar Feature of UCC57108B
  9. 5Hardware Design Files
    1. 5.1 Schematics
    2. 5.2 PCB Layouts
    3. 5.3 Bill of Materials
  10. 6Compliance Information
  11. 7Additional Information
    1. 7.1 Trademarks
  12. 8Revision History

I/O Description

Table 2-2 UCC57108EVM I/O Description
PinsDescription
VCCVcc positive supply test point. Powers IC VDD pin.
VDDVDD positive supply of UCC57108 IC
VEEVEE negative supply of UCC57108 IC. Used only for UCC57108B variant.

VREF

VREF test point. Used only for UCC57108B and UCC57108C variants.

VBUSVBUS positive supply test point. Bus voltage for external power device.
GNDMultiple test points. Ground at UCC57108 IC.
IN_INInput signal test point. Powers IC IN pin.
INSignal input of UCC57108 IC.
EN_INEnable signal test point. Powers IC EN pin. Used only for UCC57108W variant.
ENEnable of UCC57108 IC. Used only for UCC57108W variant.
DESATDESAT input of UCC57108 IC.
FLTFault output of UCC57108 IC.
GateGate test point of UCC57108 IC. Connected to 1nF capacitor and gate of external FET.
OUT/OUTHOutput pin of UCC57108 IC before external gate resistor. OUTH is used only for UCC57108C variant.
OUTLLow output pin for UCC57108. Used only for UCC57108C variant.
DrainDrain test point for external FET.