SLUUCX0A February 2024 – June 2024
Pins | Description |
---|---|
VCC | Vcc positive supply test point. Powers IC VDD pin. |
VDD | VDD positive supply of UCC57108 IC |
VEE | VEE negative supply of UCC57108 IC. Used only for UCC57108B variant. |
VREF | VREF test point. Used only for UCC57108B and UCC57108C variants. |
VBUS | VBUS positive supply test point. Bus voltage for external power device. |
GND | Multiple test points. Ground at UCC57108 IC. |
IN_IN | Input signal test point. Powers IC IN pin. |
IN | Signal input of UCC57108 IC. |
EN_IN | Enable signal test point. Powers IC EN pin. Used only for UCC57108W variant. |
EN | Enable of UCC57108 IC. Used only for UCC57108W variant. |
DESAT | DESAT input of UCC57108 IC. |
FLT | Fault output of UCC57108 IC. |
Gate | Gate test point of UCC57108 IC. Connected to 1nF capacitor and gate of external FET. |
OUT/OUTH | Output pin of UCC57108 IC before external gate resistor. OUTH is used only for UCC57108C variant. |
OUTL | Low output pin for UCC57108. Used only for UCC57108C variant. |
Drain | Drain test point for external FET. |