SLVAEJ5C February   2020  – December 2020 TPS62810-Q1 , TPS62811-Q1 , TPS62812-Q1 , TPS62813-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
  5. 5Revision History

1 Overview

This document contains information for TPS62810-Q1, TPS62811-Q1, TPS62812-Q1, TPS62813-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards.
  • Component failure modes and their distribution (FMD) based on the primary function of the device.
  • Pin failure mode analysis (Pin FMA).

Figure 1-1 shows the device functional block diagram for reference.

GUID-815B3DA4-97D3-4248-8CD9-07AC80A84996-low.gifFigure 1-1 Functional Block Diagram

TPS6281x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.