SLVSIN3 May   2025 ADS9117 , ADS9118 , ADS9119

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Thermal Information
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Switching Characteristics
    8. 6.8  Timing Diagrams
    9. 6.9  Typical Characteristics: All Devices
    10. 6.10 Typical Characteristics: ADS9119
    11. 6.11 Typical Characteristics: ADS9118
    12. 6.12 Typical Characteristics: ADS9117
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
      2. 7.3.2 Analog Input Bandwidth
      3. 7.3.3 ADC Transfer Function
      4. 7.3.4 Reference Voltage
      5. 7.3.5 Temperature Sensor
      6. 7.3.6 Data Averaging
      7. 7.3.7 Digital Down Converter
      8. 7.3.8 Data Interface
        1. 7.3.8.1 Data Frame Width
        2. 7.3.8.2 ADC Output Data Randomizer
        3. 7.3.8.3 Synchronizing Multiple ADCs
        4. 7.3.8.4 Test Patterns for Data Interface
          1. 7.3.8.4.1 Fixed Pattern
          2. 7.3.8.4.2 Alternating Test Pattern
          3. 7.3.8.4.3 Digital Ramp
      9. 7.3.9 ADC Sampling Clock Input
    4. 7.4 Device Functional Modes
      1. 7.4.1 Reset
      2. 7.4.2 Power-Down Options
      3. 7.4.3 Normal Operation
      4. 7.4.4 Initialization Sequence
    5. 7.5 Programming
      1. 7.5.1 Register Write
      2. 7.5.2 Register Read
      3. 7.5.3 Multiple Devices: Daisy-Chain Topology for SPI Configuration
        1. 7.5.3.1 Register Write With Daisy-Chain
        2. 7.5.3.2 Register Read With Daisy-Chain
  9. 8 Register Map
    1. 8.1 Register Bank 0
    2. 8.2 Register Bank 1
    3. 8.3 Register Bank 2
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Data Acquisition (DAQ) Circuit for a ≤20kHz Input Signal Bandwidth
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Data Acquisition (DAQ) Circuit for a ≤100kHz Input Signal Bandwidth
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Application Curves
      3. 9.2.3 Data Acquisition (DAQ) Circuit for a ≤1MHz Input Signal Bandwidth
        1. 9.2.3.1 Design Requirements
        2. 9.2.3.2 Application Curves
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Mechanical Data

6.4 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
POWER SUPPLY
AVDD_5V Power supply AVDD_5V to GND 4.75 5 5.25 V
VDD_1V8 Power supply VDD_1V8 to GND 1.75 1.8 1.85 V
REFERENCE VOLTAGE
VREF Reference voltage to the ADC External reference 4.076 4.096 4.116 V
ANALOG INPUTS
VIN Absolute input voltage AINx(1) to GND VCM – 1.6 VCM + 1.6 V
FSR Full-scale input range AINP – AINM –3.2 3.2 V
VCM Common-mode input range(2) (AINP + AINM) / 2 VCMOUT – 0.07 VCMOUT + 0.07 V
TEMPERATURE RANGE
TA Ambient temperature –40 25 125 °C
(1) AINx refers to analog inputs AINAP, AINAM, AINBP, and AINBM.
(2) ADC channel is powered down if the input common-mode voltage exceeds specifications.