SNVSCN7C November   2023  – May 2025 REF54

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics REF54250
    6. 6.6  Electrical Characteristics REF54300
    7. 6.7  Electrical Characteristics REF54410
    8. 6.8  Electrical Characteristics REF54450
    9. 6.9  Electrical Characteristics REF54500
    10. 6.10 Typical Characteristics
  8. Parameter Measurement Information
    1. 7.1 Temperature Drift
    2. 7.2 Long-Term Stability
    3. 7.3 Noise Performance
      1. 7.3.1 1/f Noise
      2. 7.3.2 Broadband Noise
    4. 7.4 Thermal Hysteresis
    5. 7.5 Solder Heat Shift
    6. 7.6 Power Dissipation
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 EN Pin
      2. 8.3.2 NR Pin
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Basic Voltage Reference Connection
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Reference Attach With High Precision ADC
    3. 9.3 Power Supply Recommendation
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Long-Term Stability

Long-term stability is a key performance parameter for series voltage references in all precision applications. This is defined as variation of reference voltage over time. The long-term stability value is tested in a typical setup that reflects standard PCB board manufacturing practices. The boards are made of standard FR4 material, the board does not have special cuts or grooves around the devices or go through burn-in process to relieve the mechanical stress of the PCB. These conditions reflect real world use case scenario and common manufacturing techniques.

During the long-term stability testing, precautions are taken to make sure that only the long-term stability drift is being measured. The boards are maintained at 35°C ± 0.02°C in an oil bath. The oil bath makes sure that the temperature is constant across the device over time. The measurements are captured every 30 minutes with a calibrated 8.5 digit multimeter.

Typical long term stability characteristic are expressed as reference voltage deviation over time. Figure 7-2 shows the typical drift value for the REF54 in SOIC package VREF is 25ppm from 0 to 1000hours. Figure 7-4 shows the typical drift value for the REF54 in FKH package VREF is 3ppm from 0 to 1000hours. The REF54 experiences the highest drift in the initial 1000hr, subsequent deviation is typically lower than previous 1000hours.

REF54 Long-Term Stability SOIC 2000 Hours
                                                  (VREF)Figure 7-2 Long-Term Stability SOIC 2000 Hours (VREF)
REF54 Long-Term Stability FKH 2000 Hours
                                                (VREF)Figure 7-4 Long-Term Stability FKH 2000 Hours (VREF)
REF54 Long-Term Stability SOIC 7500 Hours
                                                  (VREF)Figure 7-3 Long-Term Stability SOIC 7500 Hours (VREF)