SPRUJ28F November 2021 – August 2025 AM68 , AM68A , TDA4AL-Q1 , TDA4VE-Q1 , TDA4VL-Q1
The PBIST (Programmable Built-In Self Test) architecture provides a memory BIST engine for varying levels of coverage across many embedded memory instances.
Built-in Self-test (BIST) is a feature that allows self testing of the memory areas and logic circuitry in an Integrated Circuit (IC) without any external test equipment. In an embedded system, these tests are typically used during boot time or shutdown of the system to check the health of an SoC. PBIST is used to test the memory regions in the SoC and provides detection for permanent faults. The primary use case for PBIST is when it is invoked at start-up providing valuable information on any stuck-at bits in the memory.
There can be multiple instances of PBIST in the SoC, and each has a number of memory regions associated with it. For further details on PBIST instances see Device Configuration -> Module Integration -> PBIST.
PBIST is expected to be run at power-up, but can be run at anytime between power-up and power-down of the device with following conditions: