SLOA305 September   2021 TMP451-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 WSON-8 DQF Package
    2. 2.2 WSON-8 DQW Package
  3. 3Failure Mode Distribution (FMD)

1 Overview

This document contains information for TMP451-Q1 (WSON-8 DQF and WSON-8 DQW package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device

Figure 1-1 shows the device functional block diagram for reference.

GUID-7D1AFE89-CC9E-4668-953B-8A6F1E6D3A47-low.gif Figure 1-1 Functional Block Diagram

TMP451-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.