SLVAEF4B August   2019  – December 2021 TPS7H4001-SP

 

  1.   Trademarks
  2. 1 Introduction
  3. 2 Single-Events Effects (SEE)
  4. 3 Test Device and Evaluation Board Information
  5. 4 Irradiation Facility and Setup
  6. 5 Depth, Range, and LETEFF Calculation
  7. 6 Test Setup and Procedures
  8. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe-Operating-Area (SOA) Results
    2. 7.2 Single Event Latch-Up (SEL) Results
    3. 7.3 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR) Results
  9. 8 Single-Event Transients (SET)
  10. 9 Summary
  11. 10Total Ionizing Dose (TID) From SEE Experiments
  12. 11References
  13. 12Revision History

Trademarks

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