Product details

Frequency (min) (MHz) 5 Frequency (max) (MHz) 7400 Resolution (Bits) 14 Sample/update rate (Msps) 12000 Number of DAC channels 2 Interpolation 12x, 16x, 24x, 32x, 36x, 48x, 4x, 64x, 6x, 72x, 8x, 96x Power consumption (typ) (mW) 2948 Operating temperature range (°C) -40 to 85 Rating Space
Frequency (min) (MHz) 5 Frequency (max) (MHz) 7400 Resolution (Bits) 14 Sample/update rate (Msps) 12000 Number of DAC channels 2 Interpolation 12x, 16x, 24x, 32x, 36x, 48x, 4x, 64x, 6x, 72x, 8x, 96x Power consumption (typ) (mW) 2948 Operating temperature range (°C) -40 to 85 Rating Space
FCBGA (ALK) 400 289 mm² (17 mm × 17 mm)
  • Request full data sheet
  • Radiation hardness assured AFE7903-SP:
    • Single-event latch up (SEL): 70 MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 100 krad(Si)
  • Radiation tolerant AFE7903-SEP:
    • Single-event latch up (SEL): 43 MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30 krad(Si)
  • Dual RF sampling 12GSPS transmit DACs
  • Dual RF sampling 3GSPS receive ADCs
  • Maximum signal bandwidth per TX or RX: 400MHz
  • RF frequency range: 5MHz - 7.4GHz
  • Digital step attenuators (DSA):
    • TX: 40dB range, 0.125dB steps
    • RX: 25dB range, 0.5dB steps
  • Single or dual-band DUC/DDCs for TX and RX
    • 16x NCOs per TX/RX
  • Optional Internal PLL or VCO for DAC or ADC clocks
  • External clock at DAC or ADC sample rate
  • SYSREF Alignment Detector
  • SerDes data interface:
    • JESD204B and JESD204C compatible
    • 8 SerDes transceivers up to 29.5Gbps
    • Subclass 1 multi-device synchronization
  • Supports aerospace and defense applications
    • Controlled baseline
    • One fabrication, assembly, and test site
    • Product traceability
    • Extended product life cycle
    • Radiation lot acceptance Test (RLAT) (AFE7903-SEP/SP only)
    • Meets ASTM E595 out-gassing specification
    • Production burn-in (AFE7903-SP only)
  • This device contains non-encapsulated chip-caps with tin (Sn) finish of >97% purity. See reliability report for more information
  • Request full data sheet
  • Radiation hardness assured AFE7903-SP:
    • Single-event latch up (SEL): 70 MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 100 krad(Si)
  • Radiation tolerant AFE7903-SEP:
    • Single-event latch up (SEL): 43 MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30 krad(Si)
  • Dual RF sampling 12GSPS transmit DACs
  • Dual RF sampling 3GSPS receive ADCs
  • Maximum signal bandwidth per TX or RX: 400MHz
  • RF frequency range: 5MHz - 7.4GHz
  • Digital step attenuators (DSA):
    • TX: 40dB range, 0.125dB steps
    • RX: 25dB range, 0.5dB steps
  • Single or dual-band DUC/DDCs for TX and RX
    • 16x NCOs per TX/RX
  • Optional Internal PLL or VCO for DAC or ADC clocks
  • External clock at DAC or ADC sample rate
  • SYSREF Alignment Detector
  • SerDes data interface:
    • JESD204B and JESD204C compatible
    • 8 SerDes transceivers up to 29.5Gbps
    • Subclass 1 multi-device synchronization
  • Supports aerospace and defense applications
    • Controlled baseline
    • One fabrication, assembly, and test site
    • Product traceability
    • Extended product life cycle
    • Radiation lot acceptance Test (RLAT) (AFE7903-SEP/SP only)
    • Meets ASTM E595 out-gassing specification
    • Production burn-in (AFE7903-SP only)
  • This device contains non-encapsulated chip-caps with tin (Sn) finish of >97% purity. See reliability report for more information

The AFE7903-x is a high performance, wide bandwidth multi-channel transceiver, integrating two RF sampling TX chains and two RF sampling RX chains. With operation up to 7.4GHz, this device enables direct RF sampling in the HF, VHF, UHF, L, S and C-band frequency ranges without the need for additional frequency conversions stages. This improvement in density and flexibility enables high-channel-count, multi-mission systems.

The TX signal paths support interpolation and digital up conversion options that deliver up to 400MHz of signal bandwidth. The output of the DUCs drives a 12GSPS DAC with a mixed mode output option to enhance 2nd Nyquist operation. The DAC output includes a variable gain amplifier (TX DSA) with 40dB range and 1dB analog and 0.125dB digital steps.

Each RX chain includes a 25dB range DSA (Digital Step Attenuator), followed by a 3GSPS ADC. Each receiver channel has an analog peak power detector and various digital power detectors to assist an external or internal autonomous automatic gain controller, and RF overload detectors for device reliability protection. Flexible decimation options provide optimization of data bandwidth up to 400MHz for two RX.

The AFE7903-x is a high performance, wide bandwidth multi-channel transceiver, integrating two RF sampling TX chains and two RF sampling RX chains. With operation up to 7.4GHz, this device enables direct RF sampling in the HF, VHF, UHF, L, S and C-band frequency ranges without the need for additional frequency conversions stages. This improvement in density and flexibility enables high-channel-count, multi-mission systems.

The TX signal paths support interpolation and digital up conversion options that deliver up to 400MHz of signal bandwidth. The output of the DUCs drives a 12GSPS DAC with a mixed mode output option to enhance 2nd Nyquist operation. The DAC output includes a variable gain amplifier (TX DSA) with 40dB range and 1dB analog and 0.125dB digital steps.

Each RX chain includes a 25dB range DSA (Digital Step Attenuator), followed by a 3GSPS ADC. Each receiver channel has an analog peak power detector and various digital power detectors to assist an external or internal autonomous automatic gain controller, and RF overload detectors for device reliability protection. Flexible decimation options provide optimization of data bandwidth up to 400MHz for two RX.

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Top documentation Type Title Format options Date
* Data sheet AFE7903-EP/SEP/SP: 2T2R, 5MHz to 7.4GHz, 400MHz IBW, RF-Sampling AFE with 12GSPS DACs and 3GSPS ADCs datasheet PDF | HTML Aug 13, 2026
* Radiation & reliability report AFE7903-SEP Radiation High Performance, Wide Bandwidth Multi-Channel Transceiver TID Report (Rev. A) May 14, 2026

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