Packaging information
| Package | Pins VQFN (RGP) | 20 |
| Operating temperature range (°C) -40 to 70 |
| Package qty | Carrier 3,000 | LARGE T&R |
Features for the DRV2665
- Integrated Digital Front End
- Up to 400-kHz I 2C Bus Control
- 100-Byte Internal FIFO Interface
- Immersion TS5000-Compliant
- Optional Analog Inputs
- High Voltage Piezo-Haptic Driver
- Drives up to 100 nF at 200 V PP and 300 Hz
- Drives up to 150 nF at 150 V PP and 300 Hz
- Drives up to 330 nF at 100 V PP and 300 Hz
- Drives up to 680 nF at 50 V PP and 300 Hz
- Differential Output
- 105-V Integrated Boost Converter
- Adjustable Boost Voltage
- Adjustable Boost Current Limit
- Integrated Power FET and Diode
- No Transformer Required
- 2-ms Fast Start Up Time
- 3.3- to 5.5-V Wide Supply Voltage Range
- 1.8-V Compatible, V DD Tolerant Digital Pins
Description for the DRV2665
The DRV2665 device is a piezo haptic driver with integrated 105-V boost switch, integrated power diode, integrated fully-differential amplifier, and integrated digital front end. This versatile device is capable of driving both high-voltage and low-voltage piezo haptic actuators. The input signal can be driven as haptic packets over the I 2C port or through the analog inputs.
The digital interface of the DRV2665 device is available through an I 2C compatible bus. A digital interface relieves the costly processor burden of the PWM generation or additional analog channel requirements in the host system. Any writes to the internal first-in, first-out buffer (FIFO) will automatically wake up the device and begin playing the waveform after the 2 ms internal start-up procedure. When the data flow stops or the FIFO under-runs, the DRV2665 device will automatically enter a pop-less shutdown procedure.
The boost voltage is set using two external resistors, and the boost current limit is programmable through the R EXT resistor. A typical start-up time of 2 ms makes the DRV2665 device an ideal piezo driver for fast haptic responses. Thermal overload protection prevents the device from being damaged when overdriven.