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SN54SC8T165-SEP

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Radiation-tolerant 8-bit shift register with logic-level shifter

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Data sheet

SN54SC8T165-SEP

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Data sheet Order now

Product details

Technology family SCxT Number of channels 8 Vout (min) (V) 1.2 Vout (max) (V) 5.5 Features Balanced outputs, Level shifter, Over-voltage tolerant inputs Input type TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) to
Technology family SCxT Number of channels 8 Vout (min) (V) 1.2 Vout (max) (V) 5.5 Features Balanced outputs, Level shifter, Over-voltage tolerant inputs Input type TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) to
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Vendor item drawing available, VID V62/25625-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
  • Vendor item drawing available, VID V62/25625-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg

  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability

The SN54SC8T165-SEP device is a parallel- or serial-in, serial-out 8-bit shift register. This device has two modes of operation: load data, and shift data which are controlled by the SH/LD input. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).

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The SN54SC8T165-SEP device is a parallel- or serial-in, serial-out 8-bit shift register. This device has two modes of operation: load data, and shift data which are controlled by the SH/LD input. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).

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Technical documentation

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Type Title Date
* Data sheet SN54SC8T165-SEP Radiation Tolerant, Parallel-Load 8-Bit Shift Registers datasheet PDF | HTML 20 Jan 2025
* Radiation & reliability report SN54SC8T165-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 21 Feb 2025
* Radiation & reliability report SN54SC8T165-SEP Production Flow and Reliability Report PDF | HTML 20 Feb 2025
* Radiation & reliability report SN54SC8T165-SEP Total Ionizing Dose (TID) Report 19 Feb 2025

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TSSOP (PW) 16 Ultra Librarian
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