Packaging information
| Package | Pins SOIC (D) | 14 |
| Operating temperature range (°C) -55 to 125 |
| Package qty | Carrier 2,500 | LARGE T&R |
Features for the SN74AC08-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of −55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree†
- 2-V to 6-V V CC Operation
- Inputs Accept Voltages to 6 V
- Max t pd of 7.5 ns at 5 V
(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description for the SN74AC08-EP
The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.