SN74BCT8373A
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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches - SN74BCT8373A
Datasheet
 

Models (1)

Title Category Type Date
BSDL Model of SN74BCT8373A BSDL Model ZIP 05 Dec 2000

Design kits & evaluation modules (1)

Name Part# Type
Generic Logic EVM Supporting 14 through 24 Pin PW, DB, D, DW, NS, P, N, and DGV Packages 14-24-LOGIC-EVM Evaluation Modules & Boards

Development tools (1)

Name Part# Type
Boundary-Scan Logic Models BSDL Circuit Design & Simulation