Información de empaque
| Encapsulado | Pines TSSOP (PW) | 8 |
| Rango de temperatura de funcionamiento (℃) -50 to 150 |
| Cant. de paquetes | Transportador 150 | TUBE |
Características para LM57-Q1
- Qualified for Automotive Applications, for
Commercial Device See LM57 Data Sheet - AEC-Q100 Qualified with the Following Results:
- Temperature Grade 0 Extended: −50°C to
+160°C with Excursions up to 170°C Operating
Temperature Range - Temperature Grade 0: −50°C to +150°C
Operating Temperature Range - Temperature Grade 1: −50°C to +125°C
Operating Temperature Range - HBM ESD Component Classification Level 2
- CDM ESD Component Classification Level C5
- Temperature Grade 0 Extended: −50°C to
- Trip Temperature Set by External Resistors with
Accuracy of ±2.3°C from −40°C to +150°C - Resistor Tolerance Contributes Zero Error
- Push-Pull and Open-Drain Switch Outputs
- Wide Operating Temperature Range of −50°C to
160°C - Very Linear Analog VTEMP Temp Sensor Output
with ±1.3°C Accuracy from −50°C to +150°C - Short-Circuit Protected Analog and Digital Outputs
- Latching Function for Digital Outputs
- TRIP-TEST Pin Allows In-System Testing
- Low Power Minimizes Self-Heating to Under 0.02°C
Descripción de LM57-Q1
The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to 160°C. The VTEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIP and VTEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.
Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER digital outputs will assert when the die temperature exceeds TTRIP and will de-assert when the temperature falls below a temperature equal to TTRIP minus THYST.
TOVER is active-high with a push-pull structure. TOVER is active-low with an open-drain structure. Tying TOVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVER or TOVER , confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMP pin. The system could then use this voltage to calculate the threshold of the LM57-Q1.