68-pin (GB) package image

SNJ54ACT8990GB 現行

測試匯流排控制器

現行 barcode 批次/日期 可提供批次和日期代碼選擇
與此相同: 5962-9322801MYA 此零件編號與上方所列零件編號相同。您只能依上方所列零件編號的數量訂購。

定價

數量 價格
+

額外包裝數量 | 包裝類型選項 這些產品完全相同,但包裝類型不同

5962-9322801MYA 現行 barcode 批次/日期 可提供批次和日期代碼選擇
包裝數量 | 運送包裝 21 | JEDEC TRAY (5+1)
庫存
數量 | 價格 100u | +

品質資訊

等級 Military
RoHS
REACH 受影響
引腳鍍層 / 焊球材質 SNPB
MSL 等級 / 迴焊峰值 Level-NC-NC-NC
品質、可靠性
及包裝資訊

內含資訊:

  • RoHS
  • REACH
  • 產品標記
  • 引腳鍍層 / 焊球材質
  • MSL 等級 / 迴焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中可靠性監測
檢視或下載
其他製造資訊

內含資訊:

  • 晶圓廠位置
  • 組裝地點
檢視

出口分類

*僅供參考

  • 美國 ECCN:EAR99

封裝資訊

封裝 | 引腳 CPGA (GB) | 68
作業溫度範圍 (°C) -55 to 125
包裝數量 | 運送包裝 21 | JEDEC TRAY (5+1)

SN54ACT8990 的特色

  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • Control Operation of Up to Six Parallel Target Scan Paths
  • Accommodate Pipeline Delay to Target of Up to 31 Clock Cycles
  • Scan Data Up to 232 Clock Cycles
  • Execute Instructions for Up to 232 Clock Cycles
  • Each Device Includes Four Bidirectional Event Pins for Additional Test Capability
  • Inputs Are TTL-Voltage Compatible
  • EPICTM (Enhanced-Performance Implanted CMOS) 1-m Process
  • Packaged in 44-Pin Plastic Leaded Chip Carrier (FN), 68-Pin Ceramic Pin Grid Array (GB), and 68-Pin Ceramic Quad Flat Packages (HV)

    SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

SN54ACT8990 的說明

The 'ACT8990 test-bus controllers (TBC) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components supports IEEE Standard 1149.1-1990 (JTAG) boundary scan to facilitate testing of complex circuit-board assemblies. The 'ACT8990 differ from other SCOPETM integrated circuits. Their function is to control the JTAG serial-test bus rather than being target boundary-scannable devices.

The required signals of the JTAG serial-test bus - test clock (TCK), test mode select (TMS), test data input (TDI), and test data output (TDO) can be connected from the TBC to a target device without additional logic. This is done as a chain of IEEE Standard 1149.1-1990 boundary-scannable components that share the same serial-test bus. The TBC generates TMS and TDI signals for its target(s), receives TDO signals from its target(s), and buffers its test clock input (TCKI) to a test clock output (TCKO) for distribution to its target(s). The TMS, TDI, and TDO signals can be connected to a target directly or via a pipeline, with a retiming delay of up to 31 bits. Since the TBC can be configured to generate up to six separate TMS signals [TMS (5-0)], it can be used to control up to six target scan paths that are connected in parallel (i.e., sharing common TCK, TDI, and TDO signals).

While most operations of the TBC are synchronous to TCKI, a test-off (TOFF\) input is provided for output control of the target interface, and a test-reset (TRST\) input is provided for hardware/software reset of the TBC. In addition, four event [EVENT (3-0)] I/Os are provided for asynchronous communication to target device(s). Each event has its own event generation/detection logic, and detected events can be counted by two 16-bit counters.

The TBC operates under the control of a host microprocessor/microcontroller via the 5-bit address bus [ADRS (4-0)] and the 16-bit read/write data bus [DATA (15-0)]. Read (RD\) and write (WR\) strobes are implemented such that the critical host-interface timing is independent of the TCKI period. Any one of 24 registers can be addressed for read and/or write operations. In addition to control and status registers, the TBC contains two command registers, a read buffer, and a write buffer. Status of the TBC is transmitted to the host via ready (RDY\) and interrupt (INT\) outputs.

Major commands can be issued by the host to cause the TBC to generate the TMS sequences necessary to move the target(s) from any stable test-access-port (TAP) controller state to any other stable TAP state, to execute instructions in the Run-Test/Idle TAP state, or to scan instruction or test data through the target(s). A 32-bit counter can be preset to allow a predetermined number of execution or scan operations.

Serial data that appears at the selected TDI input (TDI1 or TDI0) is transferred into the read buffer, which can be read by the host to obtain up to 16 bits of the serial-data stream. Serial data that is transmitted from the TDO output is written by the host to the write buffer.

 

The SN54ACT8990 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ACT8990 is characterized for operation from 0°C to 70°C.

 

 

 

 

 

NC - No internal connection

定價

數量 價格
+

額外包裝數量 | 包裝類型選項 這些產品完全相同,但包裝類型不同

5962-9322801MYA 現行 barcode 批次/日期 可提供批次和日期代碼選擇
包裝數量 | 運送包裝 21 | JEDEC TRAY (5+1)
庫存
數量 | 價格 100u | +

包裝類型選項

您可依零件數量選擇不同包裝類型選項,包含完整捲盤、客製化捲盤、剪切捲帶、承載管或盤。

客製化捲盤是從一個捲盤上剪切下來的連續剪切捲帶,以維持批次和日期代碼可追溯性,依要求剪切至確切數量。依照業界標準,銅墊片會在剪切捲帶兩側連接 18 英吋前後導帶,以直接送至自動組裝機器。針對客製化捲盤訂單,TI 將酌收捲帶封裝費用。

剪切捲帶是從捲盤剪切下來的一段捲帶。TI 可能使用多條剪切捲帶或承載盒,以滿足訂單要求數量。

TI 常以盒裝或管裝、盤裝方式運送承載管裝置,視現有庫存而定。所有捲帶、管或樣本盒之封裝,皆符合公司內部靜電放電與防潮保護包裝要求。

進一步了解

可提供批次和日期代碼選擇

在購物車中加入數量,並開始結帳流程以檢視可用選項,從現有庫存中選擇批次或日期代碼。

進一步了解