Automotive test

Products and reference designs

Automotive test

Block diagram


Our integrated circuits and reference designs help create high-precision automotive test equipment for accurate testing of all automotive subsystems during manufacturing and service of the vehicle.

Design requirements

New generation automotive test equipment requires:

  • High-speed transmit and receive signal chain solutions for automotive radar and wireless communication testing.
  • High-voltage and current-source measurement units for electric vehicle (EV) drivetrain systems.
  • High-speed protocol analyzers for serial bus testing.
  • High-precision spectrum analyzers for EMI/EMC compliance testing.

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Block diagram

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Technical documentation

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Type Title Date
Application note Signal Chain Noise Figure Analysis 29 Oct 2014
Application note Principles of Data Acquisition and Conversion (Rev. A) PDF | HTML 28 Jun 2018
Analog Design Journal Impact of sampling-clock spurs on ADC performance 23 Jul 2009
Application note 66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B) 20 Jun 2016
White paper Voltage-reference impact on total harmonic distortion 19 Sep 2016
Analog Design Journal Power-supply design for high-speed ADCs (Rev. A) 18 May 2015
White paper Minimum Power Specifications for High-Performance ADC Power-Supply Designs 15 Apr 2016
Analog Design Journal JESD204B multi-device synchronization: Breaking down the requirements 12 May 2015
Application note Clocking Optimization for RF Sampling Analog-to-Digital Converters (Rev. A) PDF | HTML 10 May 2022
White paper Direct RF conversion: From vision to reality 05 May 2015

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