Semiconductor test

Memory and Semiconductor Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high accuracy testers at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

Next generation semiconductor testers often require:

Highest levels of speed and accuracy through data acquisition channels
Tight temperature controls to minimize measurement drift
Precise reference voltage generation to improve measurement accuracy
Low jitter clock distribution to maximize SNR performance
Highly integrated, low-height power modules minimizing board-to-board spacing

Technical documentation

Application notes & user guides

Application Notes (9)

Title	Type	Size (KB)	Date
Zero-Drift Amplifiers: Features and Benefits (Rev. C)	PDF	448 KB	28 Jan 2021
MUX-Friendly, Precision Operational Amplifiers (Rev. B)	PDF	518 KB	17 Dec 2020
Offset Correction Methods: Laser Trim, e-Trim, and Chopper (Rev. A)	PDF	795 KB	20 Jul 2017
Improving Resolution of SAR ADC	PDF	78 KB	14 Jun 2017
System Level Protection for High Voltage Analog Multiplexers	PDF	177 KB	03 Jan 2017
Clocking Optimization for RF Sampling Analog-to-Digital Converters	PDF	261 KB	17 May 2016
Principles of Data Acquisition and Conversion (Rev. A)	PDF	132 KB	16 Apr 2015
Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)	PDF	327 KB	10 Sep 2010
Fully differential amplifier design in high-speed data acquisition systems	PDF	285 KB	28 Feb 2005

Product bulletin & white papers

White Papers (3)

Title	Type	Size (MB)	Date
Accounting for delay from multiple sources in delta-sigma ADCs (Rev. A)	PDF	688 KB	01 Feb 2018
Voltage-reference impact on total harmonic distortion	PDF	3.07 MB	01 Aug 2016
Minimum Power Specifications for High-Performance ADC Power-Supply Designs	PDF	2.13 MB	31 Mar 2016

Technical articles

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