Semiconductor test

Products and reference designs

Semiconductor test

Block diagram

Overview

Our integrated circuits and reference designs help you create high-accuracy semiconductor test designs at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

Design requirements:

    Next-generation semiconductor test designs often require:

  • Highest levels of speed and accuracy through data acquisition channels.
  • Tight temperature controls to minimize measurement drift.
  • Precise reference voltage generation to improve measurement accuracy.
  • Low jitter clock distribution to maximize signal-to-noise ratio (SNR) performance.
  • Highly-integrated, low-height power modules minimizing board-to-board spacing.

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Block diagram

Find products and reference designs for your system.

Technical documentation

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Type Title Date
Technical articles Discharge that output rail? 16 May 2014
Technical articles Inductive sensing: How can an inductive switch be used for lid open/close detection? 15 Aug 2016
Technical articles The challenge of implementing higher-power wireless charging 11 Jun 2015
Application note How to Select Precision Amplifiers for Semiconductor Testers (Rev. A) PDF | HTML 08 May 2022
Technical articles Make your power bank more reliable with output short-circuit protection 06 Dec 2016

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