Semiconductor test

Products and reference designs

Semiconductor test

Block diagram

Overview

Our integrated circuits and reference designs help you create high-accuracy semiconductor test designs at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

Design requirements:

    Next-generation semiconductor test designs often require:

  • Highest levels of speed and accuracy through data acquisition channels.
  • Tight temperature controls to minimize measurement drift.
  • Precise reference voltage generation to improve measurement accuracy.
  • Low jitter clock distribution to maximize signal-to-noise ratio (SNR) performance.
  • Highly-integrated, low-height power modules minimizing board-to-board spacing.

Extend the capabilities of this application

Block diagram

Find products and reference designs for your system.

Technical documentation

View all 5
No results found. Please clear your search and try again.
Type Title Date
Technical articles Enabling smart meter wireless connectivity with level translation 23 Oct 2019
Technical articles Energy harvesting is not new - so why isn’t everybody using it? 23 Mar 2015
Technical articles How Space-Enhanced Plastic devices address challenges in low-Earth orbit applications 19 Sep 2022
Technical articles Selecting the right battery charger for industrial applications 13 Jul 2016
Application note How to Select Precision Amplifiers for Semiconductor Testers (Rev. A) PDF | HTML 08 May 2022

Support & training

TI E2E™ forums with technical support from TI engineers

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support.

Videos