Semiconductor test

Products and reference designs

Semiconductor test

Block diagram

Overview

Our integrated circuits and reference designs help you create high-accuracy semiconductor test designs at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

Design requirements:

    Next-generation semiconductor test designs often require:

  • Highest levels of speed and accuracy through data acquisition channels.
  • Tight temperature controls to minimize measurement drift.
  • Precise reference voltage generation to improve measurement accuracy.
  • Low jitter clock distribution to maximize signal-to-noise ratio (SNR) performance.
  • Highly-integrated, low-height power modules minimizing board-to-board spacing.

Extend the capabilities of this application

Block diagram

Find products and reference designs for your system.

Technical documentation

View all 5
No results found. Please clear your search and try again.
Type Title Date
Technical articles Eight questions about monitoring and protection in hybrid and electric vehicles 22 May 2019
Technical articles A better automotive display from pixel to picture with local dimming 16 Oct 2020
Technical articles How USB will enable the future of automotive infotainment 08 Oct 2015
Application note How to Select Precision Amplifiers for Semiconductor Testers (Rev. A) PDF | HTML 08 May 2022
Technical articles Difficult to see. Always in motion is the future 04 Jan 2016

Support & training

TI E2E™ forums with technical support from TI engineers

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support.

Videos