- Includes 4 TPD1S414YZ’s for evaluation
- Includes a USB 2.0 throughput channel
- Includes built-in equipment protection for surge testing
- Includes Kelvin connections for accurate measurements across the device FET
Texas Instruments TPD1S414EVM
The TPD1S414EVM includes 4 TPD1S414YZ’s in various configurations for testing. Three of the TPD1S414YZ’s are configured for IEC61000-4-5 (8/20 μs) compliance testing; one TPD1S414YZ is configured for throughput on USB 2.0 Type A connectors for throughput analysis.