- IEC61000-4-2 compliance testing
- 4-port s-parameter analysis
- Electrostatic discharge (ESD) clamping waveforms during an ESD event
Texas Instruments TPD6F002-Q1EVM
The TPD6F002-Q1EVM contains two TPD6F002-Q1’s. One TPD6F002-Q1 (U1) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a vector network analyzer. One TPD6F002-Q1 (U2) is configured with test points for striking ESD to the protection pins and is also configured for capturing clamping waveforms using J5 with an oscilloscope during an ESD test.