LM57FEPWQ1

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LM57FEPWQ1

Automotive Grade, ±0.7°C Temperature Sensor with Resistor-Programmable Temp Switch

Packaging

Package | PIN: PW | 8
Temp: S (-50 to 150)
Carrier: Partial Tube
Qty Price
1-9 $2.00
10-24 $1.79
25-99 $1.67
100-249 $1.45
250-499 $1.34
500-749 $1.12
750-999 $0.92
1000+ $0.85

Features

  • Qualified for Automotive Applications, for
    Commercial Device See LM57 Data Sheet
  • AEC-Q100 Qualified with the Following Results:
    • Temperature Grade 0 Extended: −50°C to
      +160°C with Excursions up to 170°C Operating
      Temperature Range
    • Temperature Grade 0: −50°C to +150°C
      Operating Temperature Range
    • Temperature Grade 1: −50°C to +125°C
      Operating Temperature Range
    • HBM ESD Component Classification Level 2
    • CDM ESD Component Classification Level C5
  • Trip Temperature Set by External Resistors with
    Accuracy of ±2.3°C from −40°C to +150°C
  • Resistor Tolerance Contributes Zero Error
  • Push-Pull and Open-Drain Switch Outputs
  • Wide Operating Temperature Range of −50°C to
    160°C
  • Very Linear Analog VTEMP Temp Sensor Output
    with ±1.3°C Accuracy from −50°C to +150°C
  • Short-Circuit Protected Analog and Digital Outputs
  • Latching Function for Digital Outputs
  • TRIP-TEST Pin Allows In-System Testing
  • Low Power Minimizes Self-Heating to Under 0.02°C

Texas Instruments  LM57FEPWQ1

The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to 160°C. The VTEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIP and VTEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER digital outputs will assert when the die temperature exceeds TTRIP and will de-assert when the temperature falls below a temperature equal to TTRIP minus THYST.

TOVER is active-high with a push-pull structure. TOVER is active-low with an open-drain structure. Tying TOVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVER or TOVER , confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMP pin. The system could then use this voltage to calculate the threshold of the LM57-Q1.