Testing for robustness
00:11:19
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25 FEB 2015
| This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients. |
Resources
download Presentation & quiz-
arrow-right Learn more about the TI Precision Labs - Op Amp Evaluation Module used in the hands-on lab modules -
arrow-right Learn more about the National Instruments VirtualBench -
arrow-right Download and install TINA-TI, the preferred simulator used exclusively with TI Precision Labs - Op Amps -
arrow-right Download the Analog Engineer's Pocket Reference e-book
This video is part of a series
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Precision labs series: Op amps
video-playlist (61 videos)