SNOAA62A February 2023 – February 2023 LMP7704-SP
This study characterizes the various Single-Event Effects (SEE) of heavy-ion irradiation of the LMP7704-SP. This device is a radiation-hardened, quad-channel, low offset voltage, rail-to-rail input and output (RRIO) precision amplifier with a CMOS input stage. No incidences of Single-Event Latch-up (SEL) were detected up to LETEFF = 85 MeV-cm2/mg at 125°C. Single-Event Transients (SET) were detected and characterized from LETEFF 2 to 85 MeV-cm2/mg at 25°C.