Model Version A (Released October 2022)

The PLECS model provided herewith can be used to simulate the TI GaN FET operation in the desired power converter and estimate the FET power losses. This also allows estimation of the FET junction temperature according to the user-specified thermomechanical inputs such as thermal resistance from junction-to-case. Adjustability of the TI GaN FET's drain-to-source slew-rate during turn-on is enabled with a parameter entry by the user to appropriately model the power loss during hard-switching. Variation of the FET on-resistance and switching losses with junction temperature is modeled in the thermal domain. The integrated protection features of TI GaN products are not modeled.

Three configurations of the model are provided to the user to choose from:

For Versions 1 and 3, the FET must be placed on a heatsink and appropriate values must be specified. Under "Thermal" tab, "initial junction temperature" or "case-to-heatsink thermal resistance" must be entered. Default initial temp=25C, Rth_ch=0.1C/W.

All the configurations require use of a .xml thermal file, which contains default parameter values. These .xml can be found in the model folder. You do not need to provide a value for device parameters that show their default values in gray, but you can overwrite these to a different value.

Revision History: Model version A - initial release

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This model is designed as an aid for customers of Texas Instruments.
TI and its licensors and suppliers make no warranties, either expressed
or implied, with respect to this model, including the warranties of
merchantability or fitness for a particular purpose. The model is
provided solely on an "as is" basis. The entire risk as to its quality
and performance is with the customer.
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