SBASAI6 September   2023 ADC32RF52

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Revision History
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Consumption
    6. 6.6  Electrical Characteristics - DC Specifications
    7. 6.7  Electrical Characteristics - AC Specifications (Dither DISABLED)
    8. 6.8  Electrical Characteristics - AC Specifications (Dither ENABLED)
    9. 6.9  Timing Requirements
    10. 6.10 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
        1. 7.3.1.1 Input Bandwidth and Full-Scale
        2. 7.3.1.2 Input Imbalance
        3. 7.3.1.3 Overrange Indication
        4. 7.3.1.4 Analog out-of-band dither
      2. 7.3.2 Sampling Clock Input
      3. 7.3.3 SYSREF
        1. 7.3.3.1 SYSREF Capture Detection
      4. 7.3.4 ADC Foreground Calibration
        1. 7.3.4.1 Calibration Control
        2. 7.3.4.2 ADC Switch
        3. 7.3.4.3 Calibration Configuration
      5. 7.3.5 Decimation Filter
        1. 7.3.5.1 Decimation Filter Response
        2. 7.3.5.2 Decimation Filter Configuration
        3. 7.3.5.3 20-bit Output Mode
        4. 7.3.5.4 Dynamic Switching
          1. 7.3.5.4.1 2 Lane Mode
          2. 7.3.5.4.2 1 Lane Mode
        5. 7.3.5.5 Numerically Controlled Oscillator (NCO)
        6. 7.3.5.6 NCO Frequency Programming
        7. 7.3.5.7 Fast Frequency Hopping
          1. 7.3.5.7.1 Fast frequency hopping using the GPIO1/2 pins
          2. 7.3.5.7.2 Fast frequency hopping using GPIO1/2, SEN and SDATA pins
          3. 7.3.5.7.3 Fast frequency hopping using the fast SPI
      6. 7.3.6 JESD204B Interface
        1. 7.3.6.1 JESD204B Initial Lane Alignment (ILA)
          1. 7.3.6.1.1 SYNC Signal
        2. 7.3.6.2 JESD204B Frame Assembly
        3. 7.3.6.3 JESD204B Frame Assembly in Bypass Mode
        4. 7.3.6.4 JESD204B Frame Assembly with Complex Decimation - Single Band
        5. 7.3.6.5 JESD204B Frame Assembly with Complex Decimation - Dual Band
        6. 7.3.6.6 JESD204B Frame Assembly with Complex Decimation - Quad Band
      7. 7.3.7 SERDES Output MUX
      8. 7.3.8 Test Pattern
        1. 7.3.8.1 Transport Layer
        2. 7.3.8.2 Link Layer
        3. 7.3.8.3 Internal Capture Memory Buffer
    4. 7.4 Device Functional Modes
      1. 7.4.1 Digital Averaging
    5. 7.5 Programming
      1. 7.5.1 GPIO Pin Control
      2. 7.5.2 Configuration using the SPI interface
        1. 7.5.2.1 Register Write
        2. 7.5.2.2 Register Read
    6. 7.6 Register Maps
      1. 7.6.1 Detailed Register Description
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Wideband RF Sampling Receiver
        1. 8.2.1.1 Design Requirements
          1. 8.2.1.1.1 Input Signal Path
          2. 8.2.1.1.2 Clocking
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Sampling Clock
        3. 8.2.1.3 Application Curves
    3. 8.3 Initialization Set Up
      1. 8.3.1 Initial Device Configuration After Power-Up
        1. 8.3.1.1  STEP 1: RESET
        2. 8.3.1.2  STEP 2: Device Configuration
        3. 8.3.1.3  STEP 3: JESD Interface Configuration (1)
        4. 8.3.1.4  STEP 4: SYSREF Synchronization
        5. 8.3.1.5  STEP 5: JESD Interface Configuration (2)
        6. 8.3.1.6  STEP 6: Analog Trim Settings
        7. 8.3.1.7  STEP 7: Calibration Configuration
        8. 8.3.1.8  STEP 8: SYSREF Synchronization
        9. 8.3.1.9  STEP 9: Run Power up Calibration
        10. 8.3.1.10 STEP 10: JESD Interface Synchronization
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Test Pattern

The ADC32RF5x provides two different options to output test patterns instead of the actual output data of the ADC to simplify the serial interface and system debug of the JESD204B digital interface link. The output data path is shown in Figure 7-41.

GUID-18D3BD32-2734-44BB-BA10-0669F8127060-low.gifFigure 7-41 Test Pattern Options

The available test patterns in each block are described in Table 7-44. Both test pattern blocks replace output data from the digital block (and not from the ADC) and therefore are available in decimation or decimation bypass mode. The test patterns are synchronized with the SYSREF signal.

Table 7-44 Test Pattern Overview
TEST PATTERN LOCATIONTYPE8b/10b encodedREGISTER PAGEREGISTER
TRANSPORT LAYERCUSTOM PATTERNYesJESD
0x05 0x04
0x2E, D0
TOGGLE 1010 PATTERNYes0x2E, D1
RAMP PATTERNYes0x2E, D2
PRBS PATTERN (27.. 231)Yes0x2F, D0
LINK LAYERJESD204B TEST PATTERNSDepends0x2D, D2-D0
PRBS PATTERN (27.. 231)No0x2F, D4

The RAMP pattern provides two different output options. Internally each ADC data bus consists of parallel data streams. The RAMP pattern is generated for each stream and a different starting value can be set for each stream. By default all starting values are 0 and increment =1. For example, DDC bypass mode uses 4 internal data streams per ADC channel. Enabling a RAMP pattern would show a 'slow' ramp which increments once every 4 clock cycles with starting values set to 0 and ramp increment = 1.

On other hand a RAMP pattern which increments every clock cycle can be set using different starting values (e.g. 0/1/2/3) for the 4 streams and setting the RAMP increment to 4. Table Table 7-45 shows the register addresses for the different digital streams being used for each operating mode.

Table 7-45 Register address for RAMP starting values based on operating mode
Address
(JESD Page)
Bypass Mode
LMFS = 8224
Complex Decimation
Single Band
Complex Decimation
Dual Band
Complex Decimation
Quad Band
0xA4/A5/A6A0A1I0A1I0A1I0
0xA8/A9/AAA1A1Q0A1Q0A1Q0
0xAC/AD/AEA2A2I0A2I0
0xB0/B1/B2A3A2Q0A2Q0
0xB4/B5/B6A3I0
0xB8/B9/BAA3Q0
0xBC/BD/BEA4I0
0xC0/C1/C2A4Q0
0xC4/C5/C6B0B1I0B1I0B1I0
0xC8/C9/CAB1B1Q0B1Q0B1Q0
0xCC/CD/CEB2B2I0B2I0
0xD0/D1/D2B3B2Q0B2Q0
0xD4/D5/D6B3I0
0xD8/D9/DAB3Q0
0xDC/DD/DEB4I0
0xE0/E1/E2B4Q0