SBASAV9A October   2023  – April 2024 AFE3256

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Revision History
  6. 5Device and Documentation Support
    1. 5.1 Documentation Support
      1. 5.1.1 Related Documentation
    2. 5.2 Receiving Notification of Documentation Updates
    3. 5.3 Support Resources
    4. 5.4 Trademarks
    5. 5.5 Electrostatic Discharge Caution
    6. 5.6 Glossary
  7. 6Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
  • TFV|315
  • TFU|320
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Features

  • 256 channels
  • On-chip, 16-bit ADC
  • High performance:
    • Noise: 440 electrons RMS
      (1.2-pC input charge range)
    • Low correlated noise
    • Full-channel integral nonlinearity:
      ±2 LSB at 16 bit
    • Scan time: < 16 μs to 204.8 μs
  • Integration:
    • Programmable full-scale input charge range:
      0.3pC to 12.5pC with resolution of 0.3pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Software programmable electron or hole integration mode
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
    • On-chip temperature sensor
  • Simple power supply scheme:
    • Single 1.85V power supply operation
  • Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
  • Power-down modes: sleep and standby
  • Binning mode support
  • Custom chip-on-film (COF) packages