SBASAV9A
October 2023 – April 2024
AFE3256
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Revision History
5
Device and Documentation Support
5.1
Documentation Support
5.1.1
Related Documentation
5.2
Receiving Notification of Documentation Updates
5.3
Support Resources
5.4
Trademarks
5.5
Electrostatic Discharge Caution
5.6
Glossary
6
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
TFV|315
TFU|320
Thermal pad, mechanical data (Package|Pins)
Orderable Information
sbasav9a_oa
1
Features
256 channels
On-chip, 16-bit ADC
High performance:
Noise: 440 electrons RMS
(1.2-pC input charge range)
Low correlated noise
Full-channel integral nonlinearity:
±2 LSB at 16 bit
Scan time: < 16 μs to 204.8 μs
Integration:
Programmable full-scale input charge range:
0.3pC to 12.5pC with resolution of 0.3pC
Internal timing generator (TG)
Built-in correlated double sampler
Software programmable electron or hole integration mode
Pipelined integrate-and-read for improved throughput—data-read during integration
Serial LVDS output
On-chip temperature sensor
Simple power supply scheme:
Single 1.85V power supply operation
Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
Power-down modes: sleep and standby
Binning mode support
Custom chip-on-film (COF) packages