SLUSE86A April   2022  – April 2024 BQ76922

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison Table
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information BQ76922
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  LD Pin
    8. 6.8  Precharge (PCHG) and Predischarge (PDSG) FET Drive
    9. 6.9  FUSE Pin Functionality
    10. 6.10 REG18 LDO
    11. 6.11 REG0 Pre-regulator
    12. 6.12 REG1 LDO
    13. 6.13 Voltage References
    14. 6.14 Coulomb Counter
    15. 6.15 Coulomb Counter Digital Filter (CC1)
    16. 6.16 Current Measurement Digital Filter (CC2)
    17. 6.17 Current Wake Detector
    18. 6.18 Analog-to-Digital Converter
    19. 6.19 Cell Balancing
    20. 6.20 Cell Open Wire Detector
    21. 6.21 Internal Temperature Sensor
    22. 6.22 Thermistor Measurement
    23. 6.23 Internal Oscillators
    24. 6.24 High-side NFET Drivers
    25. 6.25 Comparator-Based Protection Subsystem
    26. 6.26 Timing Requirements – I2C Interface, 100kHz Mode
    27. 6.27 Timing Requirements – I2C Interface, 400kHz Mode
    28. 6.28 Timing Requirements – HDQ Interface
    29. 6.29 Interface Timing Diagrams
    30. 6.30 Typical Characteristics
  8. Detailed Description
    1. 7.1  Overview
    2. 7.2  Functional Block Diagram
    3. 7.3  Diagnostics
    4. 7.4  Device Configuration
      1. 7.4.1 Commands and Subcommands
      2. 7.4.2 Configuration Using OTP or Registers
      3. 7.4.3 Device Security
      4. 7.4.4 Scratchpad Memory
    5. 7.5  Measurement Subsystem
      1. 7.5.1  Voltage Measurement
        1. 7.5.1.1 Voltage Measurement Schedule
        2. 7.5.1.2 Using VC Pins for Cells Versus Interconnect
        3. 7.5.1.3 Cell 1 Voltage Validation During SLEEP Mode
      2. 7.5.2  General Purpose ADCIN Functionality
      3. 7.5.3  Coulomb Counter and Digital Filters
      4. 7.5.4  Synchronized Voltage and Current Measurement
      5. 7.5.5  Internal Temperature Measurement
      6. 7.5.6  Thermistor Temperature Measurement
      7. 7.5.7  Factory Trim of Voltage ADC
      8. 7.5.8  Voltage Calibration (ADC Measurements)
      9. 7.5.9  Voltage Calibration (COV and CUV Protections)
      10. 7.5.10 Current Calibration
      11. 7.5.11 Temperature Calibration
    6. 7.6  Primary and Secondary Protection Subsystems
      1. 7.6.1 Protections Overview
      2. 7.6.2 Primary Protections
      3. 7.6.3 Secondary Protections
      4. 7.6.4 High-Side NFET Drivers
      5. 7.6.5 Protection FETs Configuration and Control
        1. 7.6.5.1 FET Configuration
        2. 7.6.5.2 PRECHARGE and PREDISCHARGE Modes
      6. 7.6.6 Load Detect Functionality
    7. 7.7  Device Hardware Features
      1. 7.7.1  Voltage References
      2. 7.7.2  ADC Multiplexer
      3. 7.7.3  LDOs
        1. 7.7.3.1 Preregulator Control
        2. 7.7.3.2 REG1 LDO Control
      4. 7.7.4  Standalone Versus Host Interface
      5. 7.7.5  Multifunction Pin Controls
      6. 7.7.6  RST_SHUT Pin Operation
      7. 7.7.7  CFETOFF, DFETOFF, and BOTHOFF Pin Functionality
      8. 7.7.8  ALERT Pin Operation
      9. 7.7.9  Fuse Drive
      10. 7.7.10 Cell Open Wire
      11. 7.7.11 Low Frequency Oscillator
      12. 7.7.12 High Frequency Oscillator
    8. 7.8  Device Functional Modes
      1. 7.8.1 Overview
      2. 7.8.2 NORMAL Mode
      3. 7.8.3 SLEEP Mode
      4. 7.8.4 DEEPSLEEP Mode
      5. 7.8.5 SHUTDOWN Mode
      6. 7.8.6 CONFIG_UPDATE Mode
    9. 7.9  Serial Communications Interface
      1. 7.9.1 Serial Communications Overview
      2. 7.9.2 I2C Communications
      3. 7.9.3 HDQ Communications
    10. 7.10 Cell Balancing
      1. 7.10.1 Cell Balancing Overview
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Design Requirements (Example)
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Calibration Process
    3. 8.3 Random Cell Connection Support
    4. 8.4 Startup Timing
    5. 8.5 FET Driver Turn-Off
    6. 8.6 Unused Pins
  10. Power Supply Requirements
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Third-Party Products Disclaimer
    2. 11.2 Documentation Support
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • RSN|32
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Cell Balancing Overview

The BQ76922 device supports passive cell balancing by bypassing the current of a selected cell during charging or at rest, using either integrated bypass switches between cells, or external bypass FET switches. The device incorporates a voltage-based balancing algorithm which can optionally balance cells autonomously without requiring any interaction with a host processor. Or if preferred, balancing can be entirely controlled manually from a host processor. For autonomous balancing, the device will only balance non-adjacent cells in use (it does not consider inputs used to measure interconnect as cells in use). In order to avoid excessive power dissipation within the BQ76922 device, the maximum number of cells allowed to balance simultaneously can be limited by configuration setting. For host-controlled balancing, adjacent as well as non-adjacent cells can be balanced. Host-controlled balancing can be controlled using specific subcommands sent by the host. The device also returns status information regarding how long cells have been balanced through subcommands.

When host-controlled balancing is initiated using subcommands, the device starts a timer and will continue balancing until the timer reaches a programmed value, or a new balancing subcommand is issued (which resets the timer). This is included as a precaution, in case the host processor initiated balancing but then stopped communication with the BQ76922 device, so that balancing would not continue indefinitely.

The BQ76922 device can automatically balance cells using a voltage-based algorithm based on environmental and system conditions. Several settings are provided to control when balancing is allowed, which are described in detail in the BQ76922 Technical Reference Manual.

Due to the current that flows into the cell input pins on the BQ76922 device while balancing is active, the measurement of cell voltages and evaluation of cell voltage protections by the device is modified during balancing. Balancing is temporarily disabled during the regular measurement loop while the actively balanced cell is being measured by the ADC, as well as when the cells immediately adjacent to the active cell are being measured. Similarly, balancing on the top cell is disabled while the stack voltage measurement is underway. This occurs on every measurement loop, and so can result in significant reduction in the average balancing current that flows. In order to help alleviate this, additional configuration bits are provided which cause the device to slow the measurement loop speed when cell balancing is active. The BQ76922 device will insert current-only measurements after each voltage and a temperature scan loop to slow down voltage measurements and thereby increase the average balancing current.

The device includes an internal die temperature check, to disable balancing if the die temperature exceeds a programmable threshold. However, the customer should still carefully analyze the thermal effect of the balancing on the device in system. Based on the planned ambient temperature of the device during operation and the thermal properties of the package, the maximum power should be calculated that can be dissipated within the device and still ensure operation remains within the recommended operating temperature range. The cell balancing configuration can then be determined such that the device power remains below this level by limiting the maximum number of cells that can be balanced simultaneously, or by reducing the balancing current of each cell by appropriate selection of the external resistance in series with each cell.