SBOS109A September   1999  – November 2023 INA146

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics VS = ±2.25 V to ±18 V
    6. 5.6 Electrical Characteristics VS = 5 V Single Supply
    7. 5.7 Amplifier A1, A2 Performance
    8. 5.8 Typical Performance Curves
  7. 6Application and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Operating Voltage
      2. 6.1.2 Setting the Gain
      3. 6.1.3 Common-mode Range
      4. 6.1.4 Offset Trim
      5. 6.1.5 Input Impedance
  8. 7Device and Documentation Support
    1. 7.1 Third-Party Products Disclaimer
    2. 7.2 Documentation Support
      1. 7.2.1 Related Documentation
    3. 7.3 Receiving Notification of Documentation Updates
    4. 7.4 Support Resources
    5. 7.5 Trademarks
    6. 7.6 Electrostatic Discharge Caution
    7. 7.7 Glossary
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VS Supply voltage  Dual supply, VS = (VS+) – (VS–) ±18 V
Single supply, VS = (VS+) – 0 V 36
VIN+, VIN– Signal input voltage ±100 V
Signal input current ±1 mA
Output short-circuit(2) Continuous
TA Operating temperature –55 125 °C
Tstg Storage temperature –55 125 °C
TJ Junction temperature 150 °C
Lead temperature (soldering, 10 s) 240 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Short-circuit to VS / 2.