SCLS929 august   2023 SN74AHC126-Q1

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Revision History
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Switching Characteristics, VCC = 3.3 V ± 0.3 V
    7. 6.7  Switching Characteristics, VCC = 5 V ± 0.5 V
    8. 6.8  Noise Characteristics
    9. 6.9  Operating Characteristics
    10. 6.10 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Balanced CMOS 3-State Outputs
      2. 8.3.2 Standard CMOS Inputs
      3. 8.3.3 Wettable Flanks
      4. 8.3.4 Clamp Diode Structure
    4. 8.4 Device Functional Modes
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
        1. 9.2.1.1 Power Considerations
        2. 9.2.1.2 Input Considerations
        3. 9.2.1.3 Output Considerations
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 Support Resources
    3. 10.3 Trademarks
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 Glossary
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • PW|14
  • BQA|14
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Parameter Measurement Information

Phase relationships between waveforms were chosen arbitrarily for the examples listed in the following table. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tt < 3 ns.

The outputs are measured individually with one input transition per measurement.

TEST S1 S2 RL CL ΔV VCC
tPLH, tPHL OPEN OPEN 15 pF, 50 pF ALL
tPLZ, tPZL CLOSED OPEN 1 kΩ 15 pF, 50 pF 0.15 V ≤ 2.5 V
tPHZ, tPZH OPEN CLOSED 1 kΩ 15 pF, 50 pF 0.15 V ≤ 2.5 V
tPLZ, tPZL CLOSED OPEN 1 kΩ 15 pF, 50 pF 0.3 V > 2.5 V
tPHZ, tPZH OPEN CLOSED 1 kΩ 15 pF, 50 pF 0.3 V > 2.5 V

GUID-EB3CF292-AF1E-41A1-A556-76EDB85F7F6F-low.gif
(1) CL includes probe and test-fixture capacitance.
Figure 7-1 Load Circuit for 3-State Outputs
GUID-20230721-SS0I-8DSF-V0ZP-LHHGHP0QG4NS-low.svg
(3) The greater between tPZL and tPZH is the same as ten.
(4) The greater between tPLZ and tPHZ is the same as tdis.
Figure 7-3 Voltage Waveforms Propagation Delays
GUID-20230721-SS0I-VJQB-BMGP-K0S1JW76FHMX-low.svg
Noise values measured with all other outputs simultaneously switching.
Figure 7-5 Voltage Waveforms, Noise
GUID-535BFE0F-9D7B-4CA6-85AB-D09CD11F52EA-low.gif
(1) The greater between tPLH and tPHL is the same as tpd.
Figure 7-2 Voltage Waveforms Propagation Delays
GUID-20200713-CA0I-ZTM5-PTJB-WD0LZ8VNG7PG-low.gif
(1) The greater between tr and tf is the same as tt.
Figure 7-4 Voltage Waveforms, Input and Output Transition Times