SBOSAG0A October   2023  – April 2024 TMCS1133

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Insulation Specifications
    6. 6.6 Electrical Characteristics
    7. 6.7 Typical Characteristics
  8. Parameter Measurement Information
    1. 7.1 Accuracy Parameters
      1. 7.1.1 Sensitivity Error
      2. 7.1.2 Offset Error and Offset Error Drift
      3. 7.1.3 Nonlinearity Error
      4. 7.1.4 Power Supply Rejection Ratio
      5. 7.1.5 Common-Mode Rejection Ratio
      6. 7.1.6 External Magnetic Field Errors
    2. 7.2 Transient Response Parameters
      1. 7.2.1 CMTI, Common-Mode Transient Immunity
    3. 7.3 Safe Operating Area
      1. 7.3.1 Continuous DC or Sinusoidal AC Current
      2. 7.3.2 Repetitive Pulsed Current SOA
      3. 7.3.3 Single Event Current Capability
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Current Input
      2. 8.3.2 Ambient Field Rejection
      3. 8.3.3 High-Precision Signal Chain
        1. 8.3.3.1 Temperature Stability
        2. 8.3.3.2 Lifetime and Environmental Stability
      4. 8.3.4 Internal Reference Voltage
      5. 8.3.5 Current-Sensing Measurable Ranges
      6. 8.3.6 Overcurrent Detection
      7. 8.3.7 Sensor Diagnostics
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Down Behavior
  10. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Total Error Calculation Examples
        1. 9.1.1.1 Room-Temperature Error Calculations
        2. 9.1.1.2 Full-Temperature Range Error Calculations
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Device Nomenclature
    2. 10.2 Device Support
      1. 10.2.1 Development Support
    3. 10.3 Documentation Support
      1. 10.3.1 Related Documentation
    4. 10.4 Receiving Notification of Documentation Updates
    5. 10.5 Support Resources
    6. 10.6 Trademarks
    7. 10.7 Electrostatic Discharge Caution
    8. 10.8 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Room-Temperature Error Calculations

For room-temperature total error calculations, specifications across temperature and drift are ignored. As an example, consider a TMCS1133B2A with a supply voltage (VS) of 3.1V and a worst-case common-mode excursion of 600V to calculate operating-point-specific parameters. Consider a measurement error due to an external 400µT magnetic field generated by a 20ADC current flowing through an adjacent trace or conductor that is 10mm away. The full-scale current range of the device in specified conditions is slightly greater than ±31A, as shown in the Device Comparison table. In this case, the calculating error at both 25A and 12.5A highlights error dependencies on the input-current level. Table 9-1 shows the individual error components and RSS maximum total error calculations at room temperature under the conditions specified. Relative to other errors, the additional errors from CMRR, external ambient magnetic fields BEXT and nonlinearity are negligible, and can typically be excluded from total error calculations.

Table 9-1 Total Error Calculation: Room Temperature Example
ERROR COMPONENT SYMBOL EQUATION

ERROR AT

IIN = 25A

ERROR AT

IIN = 12.5A
Input offset error eIos e I o s = I O S I I N × 100 % = V O E S × I I N × 100 % = ±   1.5 m V 50 m V / A × I I N × 100 % ±0.16% ±0.32%
PSRR error ePSRR e P S R R =   P S R R × V S - 3.3 I I N × 100 % ±0.04% ±0.07%
CMRR error eCMRR e C M R R =   C M R R × V C M I I N × 100 % ±0.01% ±0.02%
External Field error eBext e B e x t = B E X T × C M F R I I N × 100 % ±0.02% ±0.03%
Sensitivity error eS Specified in Electrical Characteristics ±0.4% ±0.4%
Nonlinearity error eNL Specified in Electrical Characteristics ±0.10% ±0.10%
RSS total error eRSS e R S S = e I o s + e P S R R + e C M R R 2 + e B e x t 2 + e S 2 + e N L 2 0.46% 0.59%