JAJSG65B September   2018  – December 2018 ADS1278-SP

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      概略回路図
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: SPI Format
    7. 7.7 Timing Requirements: Frame-Sync Format
    8. 7.8 Quality Conformance Inspection
    9. 7.9 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Sampling Aperture Matching
      2. 8.3.2  Frequency Response
        1. 8.3.2.1 High-Speed, Low-Power, And Low-Speed Modes
        2. 8.3.2.2 High-Resolution Mode
      3. 8.3.3  Phase Response
      4. 8.3.4  Settling Time
      5. 8.3.5  Data Format
      6. 8.3.6  Analog Inputs (AINP, AINN)
      7. 8.3.7  Voltage Reference Inputs (VREFP, VREFN)
      8. 8.3.8  Clock Input (CLK)
      9. 8.3.9  Mode Selection (MODE)
      10. 8.3.10 Synchronization (SYNC)
      11. 8.3.11 Power-Down (PWDN)
      12. 8.3.12 Format[2:0]
      13. 8.3.13 Serial Interface Protocols
      14. 8.3.14 SPI Serial Interface
        1. 8.3.14.1 SCLK
        2. 8.3.14.2 DRDY/FSYNC (SPI Format)
        3. 8.3.14.3 DOUT
        4. 8.3.14.4 DIN
      15. 8.3.15 Frame-Sync Serial Interface
        1. 8.3.15.1 SCLK
        2. 8.3.15.2 DRDY/FSYNC (Frame-Sync Format)
        3. 8.3.15.3 DOUT
        4. 8.3.15.4 DIN
      16. 8.3.16 DOUT Modes
        1. 8.3.16.1 TDM Mode
        2. 8.3.16.2 TDM Mode, Fixed-Position Data
        3. 8.3.16.3 TDM Mode, Dynamic Position Data
        4. 8.3.16.4 Discrete Data Output Mode
      17. 8.3.17 Daisy-Chaining
      18. 8.3.18 Modulator Output
      19. 8.3.19 Pin Test Using Test[1:0] Inputs
      20. 8.3.20 VCOM Output
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントの更新通知を受け取る方法
    2. 12.2 コミュニティ・リソース
    3. 12.3 商標
    4. 12.4 静電気放電に関する注意事項
    5. 12.5 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8.3.19 Pin Test Using Test[1:0] Inputs

The test mode feature of the ADS1278-SP allows continuity testing of the digital I/O pins. In this mode, the normal functions of the digital pins are disabled and routed to each other as pairs through internal logic, as shown in Table 14. The pins in the left column drive the output pins in the right column. Note: some of the digital input pins become outputs; these outputs must be accommodated in the design. The analog input, power supply, and ground pins all remain connected as normal. The test mode is engaged by setting the pins TEST [1:0] = 11. For normal converter operation, set TEST[1:0] = 00. Do not use '01' or '10'.

Table 14. Test Mode Pin Map (Test[1:0] = 11)

TEST MODE PIN MAP
INPUT PINS OUTPUT PINS
PWDN1 DOUT1
PWDN2 DOUT2
PWDN3 DOUT3
PWDN4 DOUT4
PWDN5 DOUT5
PWDN6 DOUT6
PWDN7 DOUT7
PWDN8 DOUT8
MODE0 DIN
MODE1 SYNC
FORMAT0 CLKDIV
FORMAT1 FSYNC/DRDY
FORMAT2 SCLK