JAJSDY5E October   2017  – February 2020 OPA202 , OPA2202 , OPA4202

PRODUCTION DATA.  

  1. 特長
  2. アプリケーション
  3. 概要
    1.     OPAx202 は大きな容量性負荷を直接駆動しても優れた性能を発揮
  4. 改訂履歴
  5. Pin Configuration and Functions
    1.     Pin Functions: OPA202
    2.     Pin Functions: OPA2202
    3.     Pin Functions: OPA4202
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA202
    5. 6.5 Thermal Information: OPA2202
    6. 6.6 Thermal Information: OPA4202
    7. 6.7 Electrical Characteristics
    8. 6.8 Typical Characteristics
    9. 6.9 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Capacitive Load and Stability
      2. 7.3.2 Output Current Limit
      3. 7.3.3 Noise Performance
      4. 7.3.4 Phase-Reversal Protection
      5. 7.3.5 Thermal Protection
      6. 7.3.6 Electrical Overstress
      7. 7.3.7 EMI Rejection
      8. 7.3.8 EMIRR +IN Test Configuration
    4. 7.4 Device Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Basic Noise Calculations
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11デバイスおよびドキュメントのサポート
    1. 11.1 デバイス・サポート
      1. 11.1.1 開発サポート
        1. 11.1.1.1 TINA-TI(無料のダウンロード・ソフトウェア)
        2. 11.1.1.2 WEBENCH Filter Designerツール
        3. 11.1.1.3 TI Precision Designs
    2. 11.2 ドキュメントのサポート
      1. 11.2.1 関連資料
    3. 11.3 関連リンク
    4. 11.4 ドキュメントの更新通知を受け取る方法
    5. 11.5 サポート・リソース
    6. 11.6 商標
    7. 11.7 静電気放電に関する注意事項
    8. 11.8 Glossary
  12. 12メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

EMIRR +IN Test Configuration

Figure 45 shows the circuit configuration for testing the EMIRR IN+. An RF source is connected to the op amp noninverting input pin using a transmission line. The op amp is configured in a unity-gain buffer topology with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM). A large impedance mismatch at the op amp input causes a voltage reflection; however, this effect is characterized and accounted for when determining the EMIRR IN+. The resulting DC offset voltage is sampled and measured by the multimeter. The LPF isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.

OPA202 OPA2202 OPA4202 EMIRR_Test_CKT_SBOS079.gifFigure 45. EMIRR +IN Test Configuration