JAJSI77B November   2019  – May 2022 TLIN1028S-Q1

PRODUCTION DATA  

  1. 特長
  2. アプリケーション
  3. 概要
  4. Revision History
  5. 概要 (続き)
  6. Pin Configuration and Functions
  7. Specification
    1. 7.1 ABSOLUTE MAXIMUM RATINGS
    2. 7.2 ESD RATINGS
    3. 7.3 ESD RATINGS, IEC SPECIFICATION
    4. 7.4 RECOMMENDED OPERATING CONDITIONS
    5. 7.5 THERMAL INFORMATION
    6. 7.6 POWER SUPPLY CHARACTERISTICS
    7. 7.7 ELECTRICAL CHARACTERISTICS
    8. 7.8 AC SWITCHING CHARACTERISTICS
    9. 7.9 Typical Characteristics
  8. Parameter Measurement Information
    1. 8.1 Test Circuit: Diagrams and Waveforms
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 LIN Pin
        1. 9.3.1.1 LIN Transmitter Characteristics
        2. 9.3.1.2 LIN Receiver Characteristics
          1. 9.3.1.2.1 Termination
      2. 9.3.2 TXD (Transmit Input)
      3. 9.3.3 RXD (Receive Output)
      4. 9.3.4 VSUP (Supply Voltage)
      5. 9.3.5 GND (Ground)
      6. 9.3.6 EN (Enable Input)
      7. 9.3.7 nRST (Reset Output)
      8. 9.3.8 VCC (Supply Output)
      9. 9.3.9 Protection Features
        1. 9.3.9.1 TXD Dominant Time Out (DTO)
        2. 9.3.9.2 Bus Stuck Dominant System Fault: False Wake Up Lockout
        3. 9.3.9.3 Thermal Shutdown
        4. 9.3.9.4 Under Voltage on VSUP
        5. 9.3.9.5 Unpowered Device and LIN Bus
    4. 9.4 Device Functional Modes
      1. 9.4.1 Normal Mode
      2. 9.4.2 Sleep Mode
      3. 9.4.3 Standby Mode
      4. 9.4.4 Wake-Up Events
        1. 9.4.4.1 Wake-Up Request (RXD)
      5. 9.4.5 Mode Transitions
      6. 9.4.6 Voltage Regulator
        1. 9.4.6.1 VCC
        2. 9.4.6.2 Output Capacitance Selection
        3. 9.4.6.3 Low-Voltage Tracking
        4. 9.4.6.4 Power Supply Recommendation
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
        1. 10.2.1.1 Normal Mode Application Note
        2. 10.2.1.2 TXD Dominant State Timeout Application Note
        3. 10.2.1.3 Brownout
      2. 10.2.2 Detailed Design Procedures
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 サポート・リソース
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Test Circuit: Diagrams and Waveforms

GUID-929F9105-B29E-4A89-A739-263F4DE259A6-low.gifFigure 8-1 Test System: Operating Voltage Range with RX and TX Access
GUID-502954D2-37E2-4EBA-9980-5D3D524ED35D-low.gifFigure 8-2 RX Response: Operating Voltage Range
GUID-CA549CD5-F76E-4E26-BA3D-9171E386D5E2-low.gifFigure 8-3 LIN Bus Input Signal
GUID-7B7FC4A7-4D56-4827-9B6E-3E71FCA1EBF6-low.gifFigure 8-4 LIN Receiver Test with RX access
GUID-8466FE53-C2A8-4DCD-AA26-4897CD3896E2-low.gifFigure 8-5 Test Circuit for IBUS_LIM at Dominant State (Driver on)
GUID-365C1463-0029-4E7F-BCBC-CAA8FA6CC1B4-low.gifFigure 8-6 Test Circuit for IBUS_PAS_dom; TXD = Recessive State VBUS = 0 V
GUID-3CCAFABE-176B-4A16-9D74-3FBF8BDDF14E-low.gifFigure 8-7 Test Circuit for IBUS_PAS_rec
GUID-4AA9E259-F684-4C1A-88F0-3400D77BD53C-low.gifFigure 8-8 Test Circuit for IBUS_NO_GND Loss of GND
GUID-89A5D8C0-250B-4CCB-A953-D3EBBAAEA783-low.gifFigure 8-9 Test Circuit for IBUS_NO_BAT Loss of Battery
GUID-B4069788-AE5D-4D11-8206-49DC286EA39D-low.gifFigure 8-10 Test Circuit Slope Control and Duty Cycle
GUID-A34C8832-AD3D-45D4-895F-E07CDDFB207F-low.gifFigure 8-11 Definition of Bus Timing
GUID-B97834D7-2463-4F57-B2FD-6C206CDCD846-low.gifFigure 8-12 Propagation Delay Test Circuit
GUID-20BF9414-08B7-40BE-83F3-37B88A664AB6-low.gifFigure 8-13 Propagation Delay
GUID-E6ABFA00-5D12-4C01-9253-03D405741E70-low.gifFigure 8-14 Mode Transitions
GUID-389E73A4-66AB-4025-AFC4-9C493C9E1148-low.gifFigure 8-15 Wakeup Through EN
GUID-287B2F00-53E6-492C-B3D3-B9AD58BA1E53-low.gifFigure 8-16 Wakeup through LIN
GUID-981D5C78-6EDB-496C-8042-E434B1933956-low.gifFigure 8-17 Test Circuit for AC Characteristics