4 Revision History
Changes from Revision A (November 2003) to Revision B (March 2022)
- ドキュメント全体にわたって表、図、相互参照の採番方法を更新Go
- 「ピンの機能」、「ESD 定格」、「熱に関する情報」、「推奨動作条件」、「電気的特性」の各表、および「詳細説明」、「概要」、「機能ブロック図」、「機能説明」、「アプリケーションと実装」、「デバイスおよびドキュメントのサポート」、「メカニカル、パッケージ、および注文情報」セクションを追加Go
- Added Pin Functions tableGo
- Changed operating temperature minimum value from –55°C to –40°C in
Absolute Maximum Ratings
Go
- Deleted thermal resistance, θJA specification of 150 °C/W
from Electrical Characteristics; added a Thermal Information
table, with RθJA = 128.2 °C/W and other detailed thermal
parameters.Go
- Changed span error test condition from: IIN = 250 µA to
25 mA to: IOUT = 250 µA to 25 mA in Electrical
Characteristics
Go
- Changed VREF voltage accuracy vs load typical value from
±100 ppm/mA to ±200 ppm/mA in Electrical Characteristics
Go
- Changed bias current vs temperature typical value from 150 pA/°C
to 300 pA/°C in Electrical Characteristics
Go
- Changed Basic Circuit Connections application diagramGo
- Changed External Transistor applications information section to
incorporate additional guidance regarding transistor power dissipation and thermal
concernsGo
- Added Circuit Stability application information
sectionGo