SBAU421B June   2023  – December 2023 TMCS1123

 

  1.   1
  2.   TMCS1123xEVM
  3.   Trademarks
  4. 1General Texas Instruments High Voltage Evaluation (TI HV EVM) User Safety Guidelines
  5. 2Overview
    1. 2.1 Kit Contents
    2. 2.2 Related Documentation From Texas Instruments
  6. 3Hardware
    1. 3.1 Features
    2. 3.2 Circuitry
      1. 3.2.1 Bypass Capacitors
      2. 3.2.2 Output Filter
      3. 3.2.3 Overcurrent Set Point and Overcurrent Circuitry
      4. 3.2.4 Load Connectors
      5. 3.2.5 TMCS1123 Isolated Current-Sense Amplifier
  7. 4Operation
    1. 4.1 Measurements
    2. 4.2 Advanced Measurement Tips
  8. 5Schematics, PCB Layout, and Bill of Materials
    1. 5.1 Schematics
    2. 5.2 PCB Layout
    3. 5.3 Bill of Materials
  9. 6Revision History

Measurements

The following procedures are used to configure a measurement evaluation with an electronic load.

For low-side measurements:

  1. Connect the electronic load positive input terminal to the positive terminal of a supply capable of sourcing the desired amount of maximum load current (see Figure 4-1)
  2. Connect the electronic load negative output terminal to the load sinking terminal of the EVM
  3. Connect the load sourcing terminal of the EVM (IN+ or IN–) to the external supply GND
  4. Turn on all the connected supplies
  5. Apply load with electronic load or actual system load
  6. Measure the output voltage at the VOUT test point

For high-side measurements:

  1. Connect the electronic load positive input terminal to the load sourcing terminal (IN+ or IN–) of the EVM. For high-side measurement of forward current, IN– sources to the electronic load; for reverse current, IN+ sources to the load.
  2. Connect the electronic load negative output terminal to the external supply GND terminal
  3. Connect the external supply to the load sinking terminal of the EVM
  4. Turn on all the connected supplies
  5. Apply load with electronic load or actual system load
  6. Measure the output voltage at the VOUT test point

Note:

The output voltage is equal to the sensitivity of the device multiplied by the load current passing through the leadframe of the DUT.