SBOK029D April   2018  – November 2023 TMP461-SP

 

  1.   1
  2.   TMP461-SP Single-Event Effects (SEE) Radiation Test Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 SET Results
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10.   A Confidence Interval Calculations
  11.   B References
  12.   Revision History

Test Device and Test Board Information

The TMP461-SP is packaged in a 10-pin, thermally-enhanced, dual ceramic flat pack package (CFP) shown with pinout in Figure 3-1. The TMP461 evaluation board used for the SEE characterization is shown in Figure 3-2 and schematics are shown in Figure 3-3.


GUID-63722ACA-5095-416F-B57C-1C6F2874C275-low.svg
The package lid was removed to reveal the die face for all heavy ion testing.
Figure 3-1 TMP461-SP HKU (CFP, 10) Pinout Diagram
GUID-8F65D42F-0746-415F-A992-36C7FB5EFD77-low.pngFigure 3-2 TMP461EVM-CVAL Temperature Sensor Evaluation Module Board
GUID-D5B10D8D-7A1A-41F7-A29C-379E8866AA36-low.gifFigure 3-3 Schematic of TMP461EVM-CVAL Evaluation Board Used to Perform the SEE