SBOK075 October   2023 SN54SC245-SEP

PRODUCTION DATA  

  1.   1
  2.   SN54SC245-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE) Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Event Rate Calculations
  9. 6Summary
  10. 7References

1 Overview

The SN54SC245-SEP is a radiation-tolerant, 1.2 V to 5.5 V, octal bus transceivers with tri-state outputs. All eight channels are controlled by the direction (DIR) pin and output enable (OE) pin. The output enable (OE) controls all outputs in the device. When the OE pin is in the low state, the appropriate outputs are enabled as determined by the direction (DIR) pin . When the OE pin is in the high state, all outputs of the device are disabled. All disabled outputs are placed into the high-impedance state.

See the SN54SC245-SEP product page for more details. Overview Information lists device information.

Table 1-1 Overview Information
DescriptionDevice Information
TI part number SN54SC245-SEP
MLS numberSN54SC245MPWTSEP
Device function Radiation-tolerant, 1.2-V to 5.5-V, octal bus transceivers with tri-state outputs
TechnologyLBC9
Exposure facility Facility for Rare Isotope Beams (FRIB) at Michigan State University (FRIB Single Event Effects [FSEE] Facility)
Heavy ion fluence per run1 × 107 ions / cm2
Irradiation temperature 125°C (for SEL testing)