SBOK079 October   2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11References

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H2140-SEP quad-channel eFuse. Heavy-ions with LETEFF = 48 MeV × cm2/mg were used for the SEE characterization campaign. Flux of 105 ions / cm2 × s and fluences to 1 × 107 ions / cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H2140-SEP eFuse is free of destructive SEB events and SEL-free up to LETEFF = 48 MeV × cm2 / mg and across the full electrical specifications. Transients at LETEFF = 48 MeV × cm2 / mg are discussed. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE are shown for reference.