SFFS557 March   2023 ADS1113-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 VSSOP Package
    2. 2.2 UQFN Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 VSSOP Package
    2. 4.2 UQFN Package

Overview

This document contains information for the ADS1113-Q1 (VSSOP and UQFN packages) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-08A804E0-966C-47DF-8EDC-13ED79787452-low.svg Figure 1-1 Functional Block Diagram

The ADS1113-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.