This document contains information for TLC6C5716-Q1 (HTSSOP package) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards

#FIGURE11 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

TLC6C5716-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.