1 Overview

This document contains information for DRV8242-Q1 to aid in a functional safety system design. This document covers all the device package and interface variants as listed below:

HW variant in VQFN-RHL package
SPI "S" variant in VQFN-RHL package
SPI "P" variant in VQFN-RHL package

Note: The DRV8242-Q1 HW (H) and SPI (P) variants are preview only, pre-production status.

Information provided are:

Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
Component failure modes and their distribution (FMD) based on the primary function of the device
Pin failure mode analysis (Pin FMA) for all the package and interface variants

Figure 1-1 shows the functional block diagram for the HW device variant reference.

Figure 1-1 Functional Block Diagram for HW Variant

Figure 1-2 shows the functional block diagram for the SPI "S" device variant for reference.

Figure 1-2 Functional Block Diagram for SPI S Variant

Figure 1-3 shows the functional block diagram for the SPI "P" device variant for reference.

Figure 1-3 Functional Block Diagram for SPI P Variant

DRV8242-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

ADVANCE INFORMATION for preproduction products; subject to change without notice.