SFFS780 February   2024 TUSB4020BI-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the TUSB4020BI-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

  • Pin short-circuited to ground (see Table 4-2)
  • Pin open-circuited (see Table 4-3)
  • Pin short-circuited to an adjacent pin (see Table 4-4)
  • Pin short-circuited to VDD (see Table 4-5)
  • Pin short-circuited to VDD33 (see Table 4-6)

Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
Class Failure Effects
A Potential device damage that affects functionality.
B No device damage, but loss of functionality.
C No device damage, but performance degradation.
D No device damage, no impact to functionality or performance.

Figure 4-1 shows the TUSB4020BI-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TUSB4020BI-Q1 data sheet.

GUID-44B2D00C-FA1C-4776-B165-84600D7D916E-low.svg Figure 4-1 Pin Diagram

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

  • Device is configured for power managed downstream ports
  • Device battery charging support is enabled
  • All device downstream ports are connected to a USB receptacle.
  • Device Upstream port is connected to a USB2 Host controller.
  • 5V BUS is present on upstream port.
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
VDD 1 Device can get damaged A
SCL/SMBCLK 2 Device not functional (I2C and SMBus not functional) B
SDA/SMBDAT 3 Device not functional (I2C and SMBus not functional) B
PWRCTL1/BATEN1 4 USB2 downstream port 1 BC1.2 not functional. Also port power not functional B
OVERCUR1Z 5 Device always communicates to system an overcurrent condition. Device never enables VBUS on the downstream port. B
PWRCTL2/BATEN2 6 USB2 downstream port 2 BC1.2 not functional. Also port power not functional B
VDD33 7 Device can get damaged A
OVERCUR2Z 8 Device always communicates to system an overcurrent has occurred. Device never enables VBUS on downstream port 2. B
USB_VBUS 9 VBUS on hub's upstream port is never detected. No communication with USB devices connected to Hub's downstream port 1 and 2 occurs. B
TEST 10 No effect. Normal operation. D
GRSTz 11 Device is held in reset and not functional B
VDD 12 Device can get damaged A
VDD33 13 Device can get damaged A
USB_DP_DN2 14 Downstream port 2 not functional B
USB_DM_DN2 15 Downstream port 2 not functional B
RSVD 16 No effect. Normal operation. D
RSVD 17 No effect. Normal operation. D
VDD 18 Device can get damaged A
RSVD 19 No effect. Normal operation. D
RSVD 20 No effect. Normal operation. D
PWRCTL_POL 21 No impact to functionality if external VBUS power switch enable polarity is active high. If polarity is active low, then VBUS for hub's downstream ports 1 and 2 are not enabled. B
SMBUSz 22 No effect if system intends to use hub in SMBus mode. If system intends to use hub in I2C mode, then I2C mode is not enabled. B
VDD33 23 Device can get damaged A
USB_R1 24 Device not functional B
VDD33 25 Device can get damaged A
USB_DP_UP 26 Upstream port not functional B
USB_DM_UP 27 Upstream port not functional B
RSVD 28 No effect. Normal operation. D
RSVD 29 No effect. Normal operation. D
VDD 30 Device can get damaged A
RSVD 31 No effect. Normal operation. D
RSVD 32 No effect. Normal operation. D
VDD33 33 Device can get damaged A
VDD 34 Device can get damaged A
GANGED/SMBA2/HSUP 35 SMBus target address can be incorrect causing SMBus operation to fail. B
FULLPWRMGMTz/SMBA1 36 SMBus target address can be incorrect causing SMBus operation to fail. B
VDD33 37 Device can get damaged A
XI 38 XI is input for oscillator. Without a clock, device is not functional. B
XO 39 No impact to functionality if external clock is provided to XI. If external crystal is used, then device is not functional. B
VDD33 40 Device can get damaged A
USB_DP_DN1 41 Downstream port 1 not functional B
USB_DM_DN1 42 Downstream port 1 not functional B
RSVD 43 No effect. Normal operation. D
RSVD 44 No effect. Normal operation. D
VDD 45 Device can get damaged A
RSVD 46 No effect. Normal operation. D
RSVD 47 No effect. Normal operation. D
VDD33 48 Device can get damaged A
Thermal pad 49 No effect. Normal operation. D
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
VDD 1 Device unpowered. Device not functional. B
SCL/SMBCLK 2 SMBus and load from an external I2C EEPROM not functional. B
SDA/SMBDAT 3 SMBus and load from an external I2C EEPROM not functional. B
PWRCTL1/BATEN1 4 Battery charge support for downstream port 1 is disabled. There is no VBUS control. B
OVERCUR1Z 5 Device has internal pull-up resistor. Overcurrent detection not functional. B
PWRCTL2/BATEN2 6 Battery charge support for downstream port 2 is disabled. There is no VBUS control. B
VDD33 7 Device unpowered. Device not functional. B
OVERCUR2Z 8 Device has internal pull-up resistor. Overcurrent detection not functional. B
USB_VBUS 9 VBUS on hub's upstream port never detected. No communication with USB devices connected to Hub's DFP can occur. B
TEST 10 No effect. Normal operation. Device has a internal pull-down. D
GRSTz 11 Device has internal pull-up resistor. No effect. Normal operation. D
VDD 12 Device unpowered. Device not functional. B
VDD33 13 Device unpowered. Device not functional. B
USB_DP_DN2 14 Downstream port 2 not functional. B
USB_DM_DN2 15 Downstream port 2 not functional. B
RSVD 16 No effect. Normal operation. D
RSVD 17 No effect. Normal operation. D
VDD 18 Device unpowered. Device not functional. B
RSVD 19 No effect. Normal operation. D
RSVD 20 No effect. Normal operation. D
PWRCTL_POL 21 Device has internal pull-down. No effect if system requires VBUS power switch enable polarity to be active high. B
SMBUSz 22 No effect if system intends to use hub in I2C mode. If system intends to use hub in SMBus mode, then SMBus not functional. B
VDD33 23 Device unpowered. Device not functional. B
USB_R1 24 Device not functional. B
VDD33 25 Device unpowered. Device not functional. B
USB_DP_UP 26 Hub upstream communication not functional. All USB2 downstream ports of hub also not functional. B
USB_DM_UP 27 Hub upstream communication not functional. All USB2 downstream ports of hub also not functional. B
RSVD 28 No effect. Normal operation. D
RSVD 29 No effect. Normal operation. D
VDD 30 Device unpowered. Device not functional. B
RSVD 31 No effect. Normal operation. D
RSVD 32 No effect. Normal operation. D
VDD33 33 Device unpowered. Device not functional. B
VDD 34 Device unpowered. Device not functional. B
GANGED/SMBA2/HSUP 35 Pin has an internal pull-up resistor. Floating pin causes device to operate in Ganged power switch mode instead of per port power switch. B
FULLPWRMGMTz/SMBA1 36 Pin has an internal pull-up resistor. Floating pin causes device to operation without downstream port power management. B
VDD33 37 Device unpowered. Device not functional. B
XI 38 XI is input for oscillator. Without a clock, device is not functional. B
XO 39 Device functional if clock provided to XI pin. If external crystal is used, then device is not functional B
VDD33 40 Device unpowered. Device not functional. B
USB_DP_DN1 41 USB2 downstream port 1 not functional. B
USB_DM_DN1 42 USB2 downstream port 1 not functional. B
RSVD 43 No effect. Normal operation. D
RSVD 44 No effect. Normal operation. D
VDD 45 Device unpowered. Device not functional. B
RSVD 46 No effect. Normal operation. D
RSVD 47 No effect. Normal operation. D
VDD33 48 Device unpowered. Device not functional. B
Thermal pad 49 Thermal performance degraded. Thermal pad is also used for device ground and leave floating can cause device to not function. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
VDD 1 I2C and SMBus not functional. B
SCL/SMBCLK 2 I2C and SMBus not functional. B
SDA/SMBDAT 3 I2C and SMBus not functional. B
PWRCTL1/BATEN1 4 I2C and SMBus not functional. Downstream port 1 VBUS control not functional. B
OVERCUR1Z 5 Overcurrent for downstream port 1 not functional. B
PWRCTL2/BATEN2 6 Downstream port 2 VBUS control not functional. B
VDD33 7 Device not functional. B
OVERCUR2Z 8 Overcurrent for downstream port 2 not functional B
USB_VBUS 9 Device not functional. B
TEST 10 Device not functional. B
GRSTz 11 Device not functional. B
VDD 12 Device can get damaged. A
VDD33 13 Device can get damaged. A
USB_DP_DN2 14 Downstream port 2 not functional. B
USB_DM_DN2 15 Downstream port 2 not functional. B
RSVD 16 Downstream piort 2 not functional. B
RSVD 17 No effect. Normal operation. D
VDD 18 No effect. Normal operation. D
RSVD 19 No effect. Normal operation. D
RSVD 20 Device not functional. B
PWRCTL_POL 21 Device not functional. B
SMBUSz 22 Device not functional. B
VDD33 23 Device can get damaged. A
USB_R1 24 Device can get damaged. A
VDD33 25 Device can get damaged. A
USB_DP_UP 26 Device can get damaged. A
USB_DM_UP 27 Upstream port not functional. B
RSVD 28 Upstream port not functional. B
RSVD 29 Device can get damaged. A
VDD 30 Device can get damaged. A
RSVD 31 Device can get damaged. A
RSVD 32 Device can get damaged. A
VDD33 33 Device can get damaged. A
VDD 34 Device can get damaged. A
GANGED/SMBA2/HSUP 35 Device not functional. B
FULLPWRMGMTz/SMBA1 36 Device not functional. B
VDD33 37 Device can get damaged. A
XI 38 Device can get damaged. A
XO 39 Device can get damaged. A
VDD33 40 Device can get damaged. A
USB_DP_DN1 41 Downstream port 1 not functional. B
USB_DM_DN1 42 Downstream port 1 not functional. A
RSVD 43 Downstream port 1 not functional. A
RSVD 44 No effect. Normal operation. D
VDD 45 No effect. Normal operation. D
RSVD 46 No effect. Normal operation. D
RSVD 47 Device can get damaged. A
VDD33 48 Device can get damaged. A
Thermal pad 49 Device can get damaged. A
Table 4-5 Pin FMA for Device Pins Short-Circuited to VDD
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
VDD 1 No effect. Normal operation. D
SCL/SMBCLK 2 Device not functional. B
SDA/SMBDAT 3 Device not functional. B
PWRCTL1/BATEN1 4 Downstream port 1 power control not functional. B
OVERCUR1Z 5 Device overcurrent detection behavior can be indeterminate since VDD is between VIL and VIH. B
PWRCTL2/BATEN2 6 Downstream port 2 power control not functional. B
VDD33 7 Device can get damaged. A
OVERCUR2Z 8 Device overcurrent detection behavior can be indeterminate since VDD is between VIL and VIH. B
USB_VBUS 9 Device can get damaged. A
TEST 10 Device behavior can be indeterminate since device can enter an internal test mode. B
GRSTz 11 Device can be in an indeterminate state because device was not reset properly. B
VDD 12 No effect. Normal operation. D
VDD33 13 Device can get damaged. A
USB_DP_DN2 14 Downstream port 2 not functional. B
USB_DM_DN2 15 Downstream port 2 not functional. B
RSVD 16 No effect. Normal operation. D
RSVD 17 No effect. Normal operation. D
VDD 18 No effect. Normal operation. D
RSVD 19 No effect. Normal operation. D
RSVD 20 No effect. Normal operation. D
PWRCTL_POL 21 Device not functional. B
SMBUSz 22 Device not functional. B
VDD33 23 Device can get damaged. A
USB_R1 24 Device not functional. B
VDD33 25 Device can get damaged. A
USB_DP_UP 26 Upstream port not functional. B
USB_DM_UP 27 Upstream port not functional. B
RSVD 28 Device can get damaged. A
RSVD 29 Device can get damaged. A
VDD 30 No effect. Normal operation. D
RSVD 31 Device can get damaged. A
RSVD 32 Device can get damaged. A
VDD33 33 Device can get damaged. A
VDD 34 No effect. Normal operation. D
GANGED/SMBA2/HSUP 35 Device not functional. B
FULLPWRMGMTz/SMBA1 36 Device not functional. B
VDD33 37 Device can get damaged. A
XI 38 Device not functional. B
XO 39 Device not functional. B
VDD33 40 Device can get damaged. A
USB_DP_DN1 41 Downstream port 1 not functional. B
USB_DM_DN1 42 Downstream port 1 not functional. B
RSVD 43 No effect. Normal operation. D
RSVD 44 No effect. Normal operation. D
VDD 45 No effect. Normal operation. D
RSVD 46 No effect. Normal operation. D
RSVD 47 No effect. Normal operation. D
VDD33 48 Device can get damaged. A
Thermal pad 49 Device can get damaged. A
Table 4-6 Pin FMA for Device Pins Short-Circuited to VDD33
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
VDD 1 Device can get damaged. A
SCL/SMBCLK 2 Device not functional. B
SDA/SMBDAT 3 Device not functional. B
PWRCTL1/BATEN1 4 Downstream port 1 power control not functional. B
OVERCUR1Z 5 Overcurrent detection for downstream port 1 not functional B
PWRCTL2/BATEN2 6 Downstream port 2 power control not functional. B
VDD33 7 No effect. Normal operation. D
OVERCUR2Z 8 Overcurrent detection for downstream port 1 not functional B
USB_VBUS 9 Device can get damaged. A
TEST 10 Device not functional. B
GRSTz 11 Device not functional. B
VDD 12 Device can get damaged. A
VDD33 13 No effect. Normal operation. D
USB_DP_DN2 14 Downstream port 2 not functional. B
USB_DM_DN2 15 Downstream port 2 not functional. B
RSVD 16 Device can get damaged. A
RSVD 17 Device can get damaged. A
VDD 18 Device can get damaged. A
RSVD 19 Device can get damaged. A
RSVD 20 Device can get damaged. A
PWRCTL_POL 21 No effect if system requires VBUS power switch enable polarity to be active low. For active high polarity, VBUS power control not functional. B
SMBUSz 22 No effect if system intends to use hub in I2C mode. If system intends to use hub in SMBus mode, then SMBus not functional. B
VDD33 23 No effect. Normal operation. D
USB_R1 24 Device can get damaged. A
VDD33 25 No effect. Normal operation. D
USB_DP_UP 26 Upstream port not functional. B
USB_DM_UP 27 Upstream port not functional. B
RSVD 28 Device can get damaged. A
RSVD 29 Device can get damaged. A
VDD 30 Device can get damaged. A
RSVD 31 Device can get damaged. A
RSVD 32 Device can get damaged. A
VDD33 33 No effect. Normal operation. D
VDD 34 Device can get damaged. A
GANGED/SMBA2/HSUP 35 Device not functional B
FULLPWRMGMTz/SMBA1 36 Device not functional B
VDD33 37 No effect. Normal operation. D
XI 38 Device can get damaged. A
XO 39 Device can get damaged. A
VDD33 40 No effect. Normal operation. D
USB_DP_DN1 41 Downstream port 1 not functional. B
USB_DM_DN1 42 Downstream port 1 not functional. B
RSVD 43 Device can get damaged. A
RSVD 44 Device can get damaged. A
VDD 45 Device can get damaged. A
RSVD 46 Device can get damaged. A
RSVD 47 Device can get damaged. A
VDD33 48 No effect. Normal operation. D
Thermal pad 49 Device can get damaged. A