SLVK152B August   2023  – November 2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report
  9.   B Appendix B: LDR TID Report
  10.   C Revision History

Test Description and Facilities

The TPS7H2140-SEP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at Texas Instruments CLAB in Dallas, Texas. The dose rate for exposure must be between 50 and 300krad(Si) / sec per MIL standard (MIL-STD-883). For the purpose of these tests, the actual dose rate for the devices was 202.039 rad(Si) / sec. After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and tested at room–temperature for post-radiation electrical evaluation using Texas Instruments ATE. ATE test limits are set per data sheet electrical limits based on qualification and characterization data.

The TPS7H2140-SEP LDR exposure was performed on biased and unbiased devices in a Co60 gamma cell under a 10-mrad(Si) / s exposure rate. The dose rate of the irradiator used in the exposure ranges from < 10 mrad(Si) / s to a maximum of approximately 65 rad(Si) / s, determined by the distance from the source. The exposure boards are housed in a lead-aluminum box (as specified in MIL-STD-883 TM 1019.9) to harden the gamma spectrum and minimize dose enhancement effects. The irradiator calibration is maintained by Logmire Laboratories using Thermoluminescence Dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST) and the dosimetry was verified using TLDs prior to the radiation exposures. After exposure, the devices were returned to TI Dallas and tested at room temperature for postradiation electrical evaluation using Texas Instruments production ATE. ATE test limits are set per data sheet electrical limits based on qualification and characterization data.