1 Overview

This document contains information for the LDC0851 (WSON package) to aid in a functional safety system design. Information provided are:

• Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards

Figure 1-1 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

The LDC0851 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.