SLVK147A August   2023  – September 2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  5. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H2201-SEP Specification Compliance Matrix
  6. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  7. 5Revision History
  8.   A Appendix: HDR TID Report Data

1.2 Device Details

Table 1-1 lists the device information used in the TID HDR characterization.

Table 1-1 Device and Exposure Details
TID HDR and LDR Details: Up to 50 krad(Si)
TI Device NumberTPS7H2201-SEP (TPS7H2201MDAPTSEP)
Package32 PIN HTSSOP (DAP)
TechnologyLinear BiCMOS 7 (LBC7)
Die Lot Number8288553
A/T Lot Number / Date Code3531002 / 36A2J3K
Quantity Tested30 irradiated units
Lot Accept/RejectAll levels tested and passed up to 50 krad(Si)
HDR Radiation FacilityDCLAB - Texas Instruments, Dallas, TX
HDR Dose Level20 krad(Si), 30 krad(Si) and 50 krad (Si)
HDR Dose Rate200 rad/s
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature
GUID-9525B9FA-EF57-4531-A504-C58B10034FC1-low.pngFigure 1-1 Device Used in Exposure