SLVK166 January 2024 TMS570LC4357-SEP
PRODUCTION DATA
*Note that qualification by similarity (“qualification family”) per JEDEC JESD47 is allowed.
| Description | Condition | Sample Size (Used or Rejects) |
Lots Required | Test Method |
|---|---|---|---|---|
| Sample Device | TMS5704357BGWTSEP | |||
| Electromigration | Maximum Recommended Operating Conditions | N/A | N/A | Per TI Design Rules |
| Wire Bond Life | Maximum Recommended Operating Conditions | N/A | N/A | Per TI Design Rules |
| Electrical Characterization | TI Data Sheet | 10 | 3 | N/A |
| Electrostatic Discharge Sensitivity | HBM per TI Data Sheet | 3 units/voltage | 1 | JEDEC JS-001 or EIA/JESD22-A114 |
| CDM per TI Data sheet | JEDEC JS-002 or EIA/JESD22-C101 | |||
| Latch-up | Per Technology | 6/0 | 1 | EIA/JESD78 |
| Physical Dimensions | TI Data Sheet | 5/0 | 1 | EIA/JESD22-B100 |
| Thermal Impedance | Theta-JA on board | Per Pin-Package | N/A | EIA/JESD51 |
| Bias Life Test | 125°C / 1000 hours or equivalent | 77/0 | 3 | JESD22-A108* |
| Biased HAST | 130°C / 85% / 96 hours or 110°C / 85% / 264 hours or 85°C / 85% / 1000 hours |
77/0 | 3 | JESD22-A110/A101* |
| Extended Biased HAST | 130°C / 85% / 250 hours or 110°C / 85% / 687 hours or 85°C / 85% / 2600 hours |
77/0 | 1 | JESD22-A110/A101* |
| Unbiased HAST | 130°C / 85% / 96 hours or equivalent | 77/0 | 3 | JESD22-A118* |
| Temperature Cycle | -65°C to +150°C non-biased 500 cycles or equivalent | 77/0 | 3 | JESD22-A104* |
| Solder Heat | 260°C for 10 seconds | 22/0 | 1 | JESD22-B106 |
| Resistance to Solvents | Ink symbol only | 12/0 | 1 | JESD22-B107 |
| Solderability | J-STD-002 | 22/0 | 1 | ANSI/J-STD-002-92 |
| Flammability | Method A / Method B | 5/0 | 1 | UL-1964 |
| Bond Shear | Per wire size | 5 units × 30/0 bonds | 3 | JESD22-B116 |
| Bond Pull Strength | Per wire size | 5 units × 30/0 bonds | 3 | ASTM F-459 |
| Die Shear | Per die size | 5/0 | 3 | MIL-STD-883, TM 2019 |
| High Temperature Storage | 150°C / 1000 hours | 15/0 | 3 | JESD22-A103* |
| Moisture Sensitivity | Surface Mount Only | 12 | 1 | J-STD-020* |
| Radiation Response Characterization | TI Data Sheet | 5 units/dose level | 1 | MIL-STD-883/Method 1019 |
| Outgassing Characterization | TML <=1% (Total Mass Lost) CVCM <=0.1% (Collected Volatile Condensable Material) |
5 | 1 | ASTM E595 |