SLVSDR3C may   2018  – may 2023 ADC12DL3200

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Revision History
  6. 5Pin Configuration and Functions
  7. 6Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics: DC Specifications
    6. 6.6  Electrical Characteristics: Power Consumption
    7. 6.7  Electrical Characteristics: AC Specifications (Dual-Channel Mode)
    8. 6.8  Electrical Characteristics: AC Specifications (Single-Channel Mode)
    9. 6.9  Timing Requirements
    10. 6.10 Switching Characteristics
    11. 6.11 Typical Characteristics
  8. 7Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Inputs
        1. 7.3.1.1 Analog Input Protection
        2. 7.3.1.2 Full-Scale Voltage (VFS) Adjustment
        3. 7.3.1.3 Analog Input Offset Adjust
      2. 7.3.2 ADC Core
        1. 7.3.2.1 ADC Theory of Operation
        2. 7.3.2.2 ADC Core Calibration
        3. 7.3.2.3 ADC Overrange Detection
        4. 7.3.2.4 Code Error Rate (CER)
        5. 7.3.2.5 Internal Dither
      3. 7.3.3 Timestamp
      4. 7.3.4 Clocking
        1. 7.3.4.1 Noiseless Aperture Delay Adjustment (tAD Adjust)
        2. 7.3.4.2 Aperture Delay Ramp Control (TAD_RAMP)
        3. 7.3.4.3 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          1. 7.3.4.3.1 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
          2. 7.3.4.3.2 Automatic SYSREF Calibration
      5. 7.3.5 LVDS Digital Interface
        1. 7.3.5.1 Multi-Device Synchronization and Deterministic Latency Using Strobes
          1. 7.3.5.1.1 Dedicated Strobe Pins
          2. 7.3.5.1.2 Reduced Width Interface With Dedicated Strobe Pins
          3. 7.3.5.1.3 LSB Replacement With a Strobe
          4. 7.3.5.1.4 Strobe Over All Data Pairs
      6. 7.3.6 Alarm Monitoring
        1. 7.3.6.1 Clock Upset Detection
      7. 7.3.7 Temperature Monitoring Diode
      8. 7.3.8 Analog Reference Voltage
    4. 7.4 Device Functional Modes
      1. 7.4.1 Dual-Channel Mode (Non-DES Mode)
      2. 7.4.2 Internal Dither Modes
      3. 7.4.3 Single-Channel Mode (DES Mode)
      4. 7.4.4 LVDS Output Driver Modes
      5. 7.4.5 LVDS Output Modes
        1. 7.4.5.1 Staggered Output Mode
        2. 7.4.5.2 Aligned Output Mode
        3. 7.4.5.3 Reducing the Number of Strobes
        4. 7.4.5.4 Reducing the Number of Data Clocks
        5. 7.4.5.5 Scrambling
        6. 7.4.5.6 Digital Interface Test Patterns and LVSD SYNC Functionality
          1. 7.4.5.6.1 Active Pattern
          2. 7.4.5.6.2 Synchronization Pattern
          3. 7.4.5.6.3 User-Defined Test Pattern
      6. 7.4.6 Power-Down Modes
      7. 7.4.7 Calibration Modes and Trimming
        1. 7.4.7.1 Foreground Calibration Mode
        2. 7.4.7.2 Background Calibration Mode
        3. 7.4.7.3 Low-Power Background Calibration (LPBG) Mode
      8. 7.4.8 Offset Calibration
      9. 7.4.9 Trimming
    5. 7.5 Programming
      1. 7.5.1 Using the Serial Interface
        1. 7.5.1.1 SCS
        2. 7.5.1.2 SCLK
        3. 7.5.1.3 SDI
        4. 7.5.1.4 SDO
        5. 7.5.1.5 78
        6. 7.5.1.6 Streaming Mode
        7. 7.5.1.7 80
    6. 7.6 Register Maps
      1. 7.6.1 SPI_REGISTER_MAP Registers
  9.   Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Wideband RF Sampling Receiver
        1. 8.2.1.1 Design Requirements
          1. 8.2.1.1.1 Input Signal Path
          2. 8.2.1.1.2 Clocking
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Calculating Values of AC-Coupling Capacitors
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Reconfigurable Dual-Channel, 2.5-GSPS or Single-Channel, 5.0-GSPS Oscilloscope
        1. 8.2.2.1 Design Requirements
          1. 8.2.2.1.1 Input Signal Path
          2. 8.2.2.1.2 Clocking
          3. 8.2.2.1.3 The ADC12DL3200
        2. 8.2.2.2 Application Curves
    3. 8.3 Initialization Set Up
    4. 8.4 Power Supply Recommendations
      1. 8.4.1 Power Sequencing
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 8Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  11. 9Mechanical, Packaging, and Orderable Information
Automatic SYSREF Calibration

The ADC12DL3200 has an automatic SYSREF calibration feature to alleviate the often challenging setup and hold times associated with capturing SYSREF for giga-sample data converters. Automatic SYSREF calibration uses the tAD adjust feature to shift the device clock to maximize the SYSREF setup and hold times or to align the sampling instance based on the SYSREF rising edge.

The ADC12DL3200 must have a proper device clock applied and be programmed for normal operation before starting the automatic SYSREF calibration. When ready to initiate automatic SYSREF calibration, a continuous SYSREF signal must be applied. SYSREF must be a continuous (periodic) signal when using the automatic SYSREF calibration. Start the calibration process by setting SRC_EN high in the SYSREF calibration enable register after configuring the automatic SYSREF calibration using the SRC_CFG register. Upon setting SRC_EN high, the ADC12DL3200 searches for the optimal tAD adjust setting until the device clock falling edge is internally aligned to the SYSREF rising edge. SRC_DONE in the SYSREF calibration status register can be monitored to ensure that the SYSREF calibration has finished. By aligning the device clock falling edge with the SYSREF rising edge, automatic SYSREF calibration maximizes the internal SYSREF setup and hold times relative to the device clock and also sets the sampling instant based on the SYSREF rising edge. After the automatic SYSREF calibration finishes, the rest of the startup procedure can be performed to finish bringing up the system.

For multi-device synchronization, the SYSREF rising edge timing must be matched at all devices and therefore trace lengths must be matched from a common SYSREF source to each ADC12DL3200. Any skew between the SYSREF rising edge at each device results in additional error in the sampling instance between devices, however repeatable deterministic latency from system startup to startup through each device must still be achieved.

Figure 7-3 provides a timing diagram of the SYSREF calibration procedure. The optimized setup and hold times are shown as tSU(OPT) and tH(OPT), respectively. The device clock and SYSREF are referred to as internal in this diagram because the phase of the internal signals are aligned within the device and not to the external (applied) phase of the device clock or SYSREF.

GUID-F55D7335-3F2A-47D9-9A30-909BA439BA35-low.gifFigure 7-3 SYSREF Calibration Timing Diagram

When finished, the tAD adjust setting found by the automatic SYSREF calibration can be read from SRC_TAD in the SYSREF calibration status register. After calibration, the system continues to use the calibrated tAD adjust setting for operation until the system is powered down. However, if desired, the SYSREF calibration can then be disabled and the tAD adjust setting can be fine-tuned according to the systems needs. Alternatively, the use of the automatic SYSREF calibration can be done at product test (or periodic recalibration) of the optimal tAD adjust setting for each system. This value can be stored and written to the TAD register (TAD_INV, TAD_COARSE, and TAD_FINE) upon system startup.

Do not run the SYSREF calibration when the ADC calibration (foreground or background) is running. If background calibration is the desired use case, disable the background calibration when the SYSREF calibration is used, then reenable the background calibration after TAD_DONE goes high. SYSREF_SEL in the clock control register 0 must be set to 0 when using SYSREF calibration.

SYSREF calibration searches the TAD_COARSE delays using both noninverted (TAD_INV = 0) and inverted clock polarity (TAD_INV = 1) to minimize the required TAD_COARSE setting in order to minimize loss on the clock path to reduce aperture jitter (tAJ).